Search International and National Patent Collections

1. (WO2017149543) SYSTEM AND METHOD FOR INTERFEROMETRIC BASED SPECTROMETRY AND COMPACT SPECTROMETER USING SAME

Pub. No.:    WO/2017/149543    International Application No.:    PCT/IL2017/050266
Publication Date: Sat Sep 09 01:59:59 CEST 2017 International Filing Date: Fri Mar 03 00:59:59 CET 2017
IPC: G01J 3/45
G02B 3/00
Applicants: CI SYSTEMS (ISRAEL) LTD.
Inventors: CABIB, Dario
Title: SYSTEM AND METHOD FOR INTERFEROMETRIC BASED SPECTROMETRY AND COMPACT SPECTROMETER USING SAME
Abstract:
An interference fringe pattern generator form's an interference fringe pattern from the light rays diffused from a region of an object positioned against a background. A planar array of detector pixels is arranged to capture an image of the interference fringe pattern. A storage medium records information indicative of intensity values of the image of the interference fringe pattern captured by a selected group of pixels of the planar array of detector pixels. The information is recorded as a function of the optical path difference values traversed by the diffused light rays through the interference fringe pattern generator for each of the pixels in the selected, group of pixels. A processor determines the spectral characteristics of the object based on the information indicative of the intensity values recorded by the storage medium and the optical path difference values traversed by the diffused light rays.