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1. (WO2017149397) SYSTEM FOR MEASURING OPTICAL PARAMETERS OF MATERIALS

Pub. No.:    WO/2017/149397    International Application No.:    PCT/IB2017/050028
Publication Date: Sat Sep 09 01:59:59 CEST 2017 International Filing Date: Fri Jan 06 00:59:59 CET 2017
IPC: G01N 21/21
Applicants: DASARI, Hanumesh Kumar
CHIYEDU, Nagaraja
Inventors: DASARI, Hanumesh Kumar
CHIYEDU, Nagaraja
Title: SYSTEM FOR MEASURING OPTICAL PARAMETERS OF MATERIALS
Abstract:
Aspects of the present disclosure relate to computer based compact optical measuring system for obtaining various optical properties including optical rotation, magnitude of optical rotation, optical absorption and transmittance of optically active organic and inorganic substances at several wavelengths, in which the need for electro optic modulation or magneto optic modulation is obviated. The disclosed system can be configured to accomplish non- destructive method of measuring both rotatory polarization and optical absorption (or transmittance) of chemical substances at several wavelengths. The disclosed system can be used as a spectropolarimeter as well as spectrophotometer by providing simple modifications to the components thereof.