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1. (WO2017147679) METHOD AND SYSTEM FOR DETERMINING WHETHER AN EVENT HAS OCCURRED FROM DYNAMIC STRAIN MEASUREMENTS
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/147679 International Application No.: PCT/CA2016/050217
Publication Date: 08.09.2017 International Filing Date: 01.03.2016
IPC:
G01B 21/32 (2006.01) ,G01B 11/16 (2006.01) ,G01M 3/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
21
Measuring arrangements or details thereof in so far as they are not adapted to particular types of measuring means of the other groups of this subclass
32
for measuring the deformation in a solid
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
16
for measuring the deformation in a solid, e.g. optical strain gauge
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
3
Investigating fluid tightness of structures
Applicants:
HIFI ENGINEERING INC. [CA/CA]; #2, 816 - 46th Avenue SE Calgary, Alberta T2G 2A6, CA
Inventors:
JALILIAN, Seyed Ehsan; CA
HULL, John; CA
HUANG, Daniel; CA
ADEYEMI, Adekunle; CA
Agent:
RIPLEY, Roch; CA
Priority Data:
Title (EN) METHOD AND SYSTEM FOR DETERMINING WHETHER AN EVENT HAS OCCURRED FROM DYNAMIC STRAIN MEASUREMENTS
(FR) PROCÉDÉ ET SYSTÈME POUR DÉTERMINER SI UN ÉVÉNEMENT S’EST PRODUIT À PARTIR DE MESURES DE CONTRAINTE DYNAMIQUE
Abstract:
(EN) Methods, systems, and techniques for determining whether an event has occurred from dynamic strain measurements involve determining, using a processor, at least one event parameter from a signal representing the dynamic strain measurements, and then having the processor use the at least one event parameter to determine whether the event has occurred. The at least one event parameter is any one or more of a measure of magnitude of the signal, frequency centroid of the signal, filtered baseline of the signal, harmonic power of the signal, and time-integrated spectrum flux of the signal.
(FR) La présente invention concerne des procédés, des systèmes et des techniques pour déterminer si un événement s’est produit à partir de mesures de contrainte dynamique qui mettent en œuvre la détermination, au moyen d’un processeur, d’au moins un paramètre d’événement à partir d’un signal représentant les mesures de contrainte dynamique, et comportant ensuite l’utilisation par un processeur de l’au moins un paramètre d’événement pour déterminer si l’événement s’est produit. L’au moins un paramètre d’événement est l’un ou plusieurs quelconques parmi une mesure d’amplitude du signal, un centroïde de fréquence du signal, une puissance harmonique du signal, et un flux de spectre intégré dans le temps du signal.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)