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1. (WO2017138034) THREE-DIMENSIONAL SURFACE POTENTIAL DISTRIBUTION MEASUREMENT SYSTEM
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/138034 International Application No.: PCT/JP2016/000643
Publication Date: 17.08.2017 International Filing Date: 08.02.2016
IPC:
G01R 29/08 (2006.01) ,G01R 31/34 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
29
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/-G01R27/135
08
Measuring electromagnetic field characteristics
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
34
Testing dynamo-electric machines
Applicants:
東芝三菱電機産業システム株式会社 TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION [JP/JP]; 東京都中央区京橋三丁目1番1号 3-1-1, Kyobashi, Chuo-ku, Tokyo 1040031, JP
国立大学法人 東京大学 THE UNIVERSITY OF TOKYO [JP/JP]; 東京都文京区本郷七丁目3番1号 3-1, Hongo 7-chome, Bunkyo-ku, Tokyo 1138654, JP
Inventors:
古川 真陽 FURUKAWA, Masaaki; JP
吉満 哲夫 YOSHIMITSU, Tetsuo; JP
坪井 雄一 TSUBOI, Yuichi; JP
日高 邦彦 HIDAKA, Kunihiko; JP
熊田 亜紀子 KUMADA, Akiko; JP
池田 久利 IKEDA, Hisatoshi; JP
Agent:
特許業務法人サクラ国際特許事務所 SAKURA PATENT OFFICE, P.C.; 東京都千代田区内神田一丁目18番14号 ヨシザワビル6階 6F Yoshizawa Bldg., 18-14, Uchikanda 1-chome, Chiyoda-ku, Tokyo 1010047, JP
Priority Data:
Title (EN) THREE-DIMENSIONAL SURFACE POTENTIAL DISTRIBUTION MEASUREMENT SYSTEM
(FR) SYSTÈME DE MESURE DE DISTRIBUTION DE POTENTIEL DE SURFACE TRIDIMENSIONNEL
(JA) 3次元表面電位分布計測システム
Abstract:
(EN) This three-dimensional surface potential distribution measurement system (100) for measuring the surface potential of an object of measurement is provided with a laser light source, a Pockels crystal having a Pockels effect in which the refractive index changes as a result of variation in the potential difference between a first end surface and second end surface, a mirror provided so as to come into contact with the second end surface, a photodetector for detecting the intensity of laser light corresponding to the potential difference of the Pockels crystal, a housing (31) for holding the above, a three-dimensional motion-driving device (30) capable of three-dimensionally driving the motion of the housing (31), and a driving control unit (50) for controlling the three-dimensional motion-driving device (30).
(FR) L'invention concerne un système de mesure de distribution de potentiel de surface tridimensionnel (100) pour mesurer le potentiel de surface d'un objet de mesure, qui comporte une source de lumière laser, un cristal de Pockels ayant un effet de Pockels dans lequel l'indice de réfraction change en fonction d'une variation de différence de potentiel entre une première surface d'extrémité et une seconde surface d'extrémité, un miroir disposé de façon à entrer en contact avec la seconde surface d'extrémité, un photodétecteur pour détecter l'intensité de lumière laser correspondant à la différence de potentiel du cristal de Pockels, un boîtier (31) pour contenir les éléments ci-dessus, un dispositif d'entraînement en mouvement tridimensionnel (30) susceptible d'entraîner le mouvement du boîtier (31) en trois dimensions, et une unité de commande d'entraînement (50) pour commander le dispositif d'entraînement en mouvement tridimensionnel (30).
(JA) 測定対象の表面電位を計測する3次元表面電位分布計測システム(100)は、レーザ光源と、第1の端面と第2の端面間の電位差の変化により屈折率が変化するポッケルス効果を有するポッケルス結晶と、第2の端面に接するように設けられたミラーと、ポッケルス結晶の電位差に対応するレーザ光の光強度を検出する光検出器と、これらを保持する筐体(31)と、筐体(31)を3次元的に移動駆動可能な3次元移動駆動装置(30)と、3次元移動駆動装置(30)を制御する駆動制御部(50)とを備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
CA3013883CN108713149EP3415933IN201817031201BR112018016078