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1. WO2017136721 - METHODS, SYSTEMS AND APPARATUS OF INTERFEROMETRY FOR IMAGING AND SENSING

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CLAIMS

Therefore, at least the following is claimed:

1. A system for imaging and sensing of a sample, comprising:

an interferometer configured to receive a sample;

a light source configured to provide light to the interferometer at multiple wavelengths (λέ), where the light is directed to the sample by optics of the interferometer; and

optical path delay (OPD) modifying optics configured to enhance contrast in an interferometer output associated with the sample, the interferometer output captured by a detector at each of the multiple wavelengths (λέ).

2. The system of claim 1 , wherein the light is a band of light having wavelengths

centered about the wavelength (λέ).

3. The system of claim 1 , wherein the light source comprises light emitting diodes

(LEDs) or lasers configured to provide the light at the multiple wavelengths (λέ).

4. The system of claim 1 , wherein the light source comprises a tunable light emitting diode (LED) or a tunable laser configured to provide the light at the multiple wavelengths (λέ).

5. The system of claim 1 , comprising one or more filters configured to filter broadband light to provide the interferometer output at each of the multiple wavelengths (λέ).

6. The system of claim 5, wherein the light source comprises a broadband light source.

7. The system of claim 6, wherein the one or more filters comprise a plurality of

bandpass filters in the light source.

8. The system of claim 5, wherein the one or more filters comprise a pixelated filter mask.

9. The system of claim 1 , wherein the OPD modifying optics comprise one or more birefringent crystals and one or more polarizers.

10. The system of claim 1 , wherein the OPD modifying optics comprise one or more phase plate.

11. The system of claim 10, wherein the OPD modifying optics further comprise a 4-f optical system.

12. The system of claim 1 , wherein the interferometer comprises a light microscope.

13. An apparatus for quantitative imaging or sensing of a sample, comprising:

optical path delay (OPD) modifying optics configured to modify an

interferometer output associated with a sample illuminated in an interferometer by light at one or more defined wavelength (λέ); and

an add-on unit containing the OPD modifying optics, the add-on unit configured to attach to the interferometer thereby aligning the OPD modifying optics with the interferometer output, and configured to attach to a detector configured to record the interferometer output.

14. The apparatus of claim 13, wherein the interferometer comprises a light microscope.

15. The apparatus of claim 13, wherein the light comes from a light source configured to change wavelength without using filters.

16. The apparatus of claim 13, wherein the OPD modifying optics comprise a phase plate positioned between relay lenses.

17. The apparatus of claim 16, wherein the add-on unit comprises one or more filters aligned with the OPD modifying optics.

18. The apparatus of claim 17, wherein the one or more filters comprise a pixelated filter mask or a plurality bandpass filters.

19. The apparatus of claim 13, wherein the OPD modifying optics comprise at least one birefringent crystals and at least one polarizer.

20. The apparatus of claim 13, wherein the add-on unit is configured to switch between different configurations of the OPD modifying optics.