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1. (WO2017136107) SHORT-RESISTANT OUTPUT PIN CIRCUITRY
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/136107 International Application No.: PCT/US2017/012764
Publication Date: 10.08.2017 International Filing Date: 09.01.2017
Chapter 2 Demand Filed: 23.10.2017
IPC:
G01R 31/02 (2006.01) ,G01R 31/28 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
02
Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
Applicants:
QUALCOMM INCORPORATED [US/US]; ATTN: International IP Administration 5775 Morehouse Drive San Diego, California 92121-1714, US
Inventors:
BANSAL, Virendra; US
GULATI, Rahul; US
BHUYAN, Pranjal; US
JAIN, Palkesh; US
Agent:
FOUNTAIN, George; US
Priority Data:
15/012,72301.02.2016US
Title (EN) SHORT-RESISTANT OUTPUT PIN CIRCUITRY
(FR) CIRCUITS DE BROCHE DE SORTIE RÉSISTANTS AUX COURTS-CIRCUITS
Abstract:
(EN) An integrated circuit (IC) is disclosed herein for short-resistant output pin circuitry. In an example aspect, an integrated circuit includes a short-resistant pin and an adjacent pin. The integrated circuit also includes a short-resistant pad that is coupled to the short-resistant pin and an adjacent pad that is coupled to the adjacent pin. The integrated circuit further includes short-resistant circuitry that is coupled to the short-resistant pad and the adjacent pad. The short-resistant circuitry is implemented to detect a short circuit condition between the short-resistant pin and the adjacent pin and to reduce an effect of the short-circuit condition on the short-resistant pin.
(FR) La présente invention concerne un circuit intégré (IC) pour des circuits de broche de sortie résistante aux courts-circuits. Selon un aspect illustratif, un circuit intégré inclut une broche résistante aux courts-circuits et une broche adjacente. Le circuit intégré inclut également une pastille résistante aux courts-circuits qui est couplée à la broche résistante aux courts-circuits et une pastille adjacente qui est couplée à la broche adjacente. Le circuit intégré inclut en outre des circuits résistants aux courts-circuits qui sont couplés à la pastille résistante aux courts-circuits et à la pastille adjacente. Les circuits résistants aux courts-circuits sont réalisés pour détecter une condition de court-circuit entre la broche résistante aux courts-circuits et la broche adjacente et pour réduire un effet de la condition de court-circuit sur la broche résistante aux courts-circuits.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
CA3010603IN201847025151ID2018/10778KR1020180108617CN108700625EP3411722
BR112018015472