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1. (WO2017130725) FOCAL POINT DETECTION DEVICE AND IMAGING DEVICE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/130725 International Application No.: PCT/JP2017/000927
Publication Date: 03.08.2017 International Filing Date: 13.01.2017
IPC:
G02B 7/34 (2006.01) ,G03B 13/36 (2006.01) ,H01L 27/14 (2006.01) ,H01L 27/146 (2006.01) ,H04N 5/225 (2006.01) ,H04N 5/369 (2011.01)
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
7
Mountings, adjusting means, or light-tight connections, for optical elements
28
Systems for automatic generation of focusing signals
34
using different areas in a pupil plane
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
B
APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
13
Viewfinders; Focusing aids for cameras; Means for focusing for cameras; Autofocus systems for cameras
32
Means for focusing
34
Power focusing
36
Autofocus systems
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14
including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14
including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144
Devices controlled by radiation
146
Imager structures
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
5
Details of television systems
222
Studio circuitry; Studio devices; Studio equipment
225
Television cameras
H ELECTRICITY
04
ELECTRIC COMMUNICATION TECHNIQUE
N
PICTORIAL COMMUNICATION, e.g. TELEVISION
5
Details of television systems
30
Transforming light or analogous information into electric information
335
using solid-state image sensors [SSIS]
369
SSIS architecture; Circuitry associated therewith
Applicants:
ソニー株式会社 SONY CORPORATION [JP/JP]; 東京都港区港南1丁目7番1号 1-7-1, Konan, Minato-ku, Tokyo 1080075, JP
Inventors:
尾辻 弘成 OTSUJI Hironari; JP
Agent:
西川 孝 NISHIKAWA Takashi; JP
稲本 義雄 INAMOTO Yoshio; JP
Priority Data:
2016-01443728.01.2016JP
Title (EN) FOCAL POINT DETECTION DEVICE AND IMAGING DEVICE
(FR) DISPOSITIF DE DÉTECTION DE POINT FOCAL ET UN DISPOSITIF D'IMAGERIE
(JA) 焦点検出装置、撮像装置
Abstract:
(EN) The present invention pertains to a focal point detection device and an imaging device configured so as to be able to adjust the minimum value of sensitivity of a position detection pixel. The present invention is provided with a light-receiving part for receiving light incident via a microlens, and a light-blocking film provided between the microlens and the light-receiving part, the light-blocking film limiting the amount of light on the light-receiving part, two or more openings being provided in the light-blocking film, and the openings allowing light to be incident on the light-receiving part. Also, the openings are constituted of a main opening and an auxiliary opening that opens more narrowly than the main opening. The present invention is applicable to an imaging device that executes autofocusing with an image plane phase difference method.
(FR) La présente invention concerne un dispositif de détection de point focal et un dispositif d'imagerie configurés de manière à pouvoir régler la valeur minimale de la sensibilité d'un pixel de détection de position. La présente invention comprend une partie de réception de lumière destinée à recevoir une lumière incidente par le biais d'une microlentille et un film de blocage de lumière disposé entre la microlentille et la partie de réception de lumière. Le film de blocage de lumière limite la quantité de lumière sur la partie de réception de lumière, deux ouvertures ou plus sont réalisées dans le film de blocage de lumière et les ouvertures permettent à la lumière d'être incidente sur la partie de réception de lumière De plus, les ouvertures sont constituées d'une ouverture principale et d'une ouverture auxiliaire qui s'ouvre plus étroitement que l'ouverture principale. La présente invention peut être appliquée à un dispositif d'imagerie qui exécute une mise au point automatique avec un procédé de différence de phase de plan d'image.
(JA) 本技術は、位相検出画素において、感度の最小値を調整することができるようにする焦点検出装置、撮像装置に関する。 マイクロレンズを介して入射された光を受光する受光部と、マイクロレンズと受光部との間に設けられ、受光部への光量を制限する遮光膜とを備え、受光部に光を入射させるための遮光膜に設けられている開口部が、2以上ある。また開口部は、主開口部と、主開口部よりも小さく開口している副開口部とから構成されている。本技術は、像面位相差方式でオートフォーカスを実行する撮像装置に適用できる。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)