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1. (WO2017130085) PROBE FOR MEASURING TURBIDITY, HIGH TURBIDITY AND/OR SUSPENDED SOLIDS AT LOW CONSUMPTION
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CLAIMS

1 . A probe for measuring turbid ity, h igh tu rbid ity and/or suspended solids at low consumption , comprising : a power source, connected to a current l im iter that supplies at least one capacitor connected to ground ; said cu rrent limiter limits the current at its output to a maximum cu rrent of 1 mA; said at least one capacitor is connected to a controlled switch , which is in tu rn connected to an electron ic circuit for measuring tu rbid ity and suspended solids; comprising a microprocessor which period ically opens said switch for a first predetermined time to recharge said at least one capacitor, and which period ically closes said switch for a second predetermined time to perform said measurement of turbid ity and suspended solids; said electronic circuit for measuring the turbidity and/or suspended solids comprises a light emitter, a first receiver of the infrared light reflected by the suspended particles, and a second control receiver of the infrared light reflected .

2. A probe accord ing to claim 1 , characterised in that it comprises a first voltage reg ulator between said power source and said current limiter.

3. A probe accord ing to one of the preceding claims, characterised in that it comprises a second voltage regulator between said at least one capacitor and said

controlled switch .

4. A probe accord ing to one of the preceding claims, characterised in that it comprises a second voltage regulator between said at least one capacitor and said m icroprocessor.

5. A probe accord ing to one of the preced ing claims, characterised in that said microprocessor is supplied by said at least one capacitor.

6. A probe according to one of the preceding claims, characterised in that said electronic circuit for measuring turbid ity and/or suspended solids comprises a temperature sensor.

7. A probe accord ing to one of the preceding claims, characterised in that said first predetermined time is g reater than said second predetermined time.

8. A probe accord ing to one of the preced ing claims, characterised in that it comprises an interface used to read the values measured by said probe and to prog ramme and/or calibrate said probe.

9. A method for measuring turbidity, high turbid ity and/or suspended solids, comprising the steps of: supplying a power to at least one capacitor by means of a current limiter, which limits the current at its output to a maximum current of 1 mA; charg ing said at least one capacitor for a first predetermined time period ; supplying an electronic circuit for measuring turbid ity and suspended solids by means of said capacitor for a second predetermined time; sending an infrared lig ht, receiving the infrared lig ht reflected by the suspended particles, and receiving the control infrared light reflected .