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1. (WO2017112040) 3-D POLARIMETRIC IMAGING USING A MICROFACET SCATTERING MODEL TO COMPENSATE FOR STRUCTURED SCENE REFLECTIONS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/112040 International Application No.: PCT/US2016/056810
Publication Date: 29.06.2017 International Filing Date: 13.10.2016
IPC:
G01B 11/24 (2006.01) ,G01J 4/04 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
4
Measuring polarisation of light
04
Polarimeters using electric detection means
Applicants:
RAYTHEON COMPANY [US/US]; 870 Winter Street Waltham, Massachusetts 02451-1449, US
Inventors:
FEST, Eric C.; US
Agent:
GIFFORD, Eric A.; US
Priority Data:
14/978,26522.12.2015US
Title (EN) 3-D POLARIMETRIC IMAGING USING A MICROFACET SCATTERING MODEL TO COMPENSATE FOR STRUCTURED SCENE REFLECTIONS
(FR) IMAGERIE POLARIMÉTRIQUE EN 3D À L'AIDE D'UN MODÈLE DE DIFFUSION À MICROFACETTES POUR COMPENSER DES RÉFLEXIONS DE SCÈNE STRUCTURÉES
Abstract:
(EN) A system and method for more accurately generating the surface normal calibration maps (AoLP) and (DoLP, ) to compensate for structured scene reflections for 3-D polarimetric imaging. This is accomplished using a microfacet scattering model to develop the functional form of a polarized bidirectional reflectance distribution function (BRDF) of the object surface. The ambient radiance is ray traced to the BRDF to create the calibration maps (AoLP) and (DoLP, ), which may be combined into a single calibration map (DoLP, AoLP). These maps are applied to the AoLP and DoLP images to compute an array of surface normals, which are then mapped to form a 3-D image of the object.
(FR) La présente invention concerne un système et un procédé permettant de générer de manière plus précise les cartes d'étalonnage de normale de surface ((AoLP) et (DoLP)) pour compenser des réflexions de scène structurées pour une imagerie polarimétrique en 3D. Ceci est réalisé à l'aide d'un modèle de diffusion à microfacettes pour développer la forme fonctionnelle d'une fonction de distribution de réflexion bidirectionnelle (BRDF pour Bidirectional Reflectance Distribution Function) polarisée de la surface de l'objet. La radiance ambiante est tracée par rayons sur la fonction BRDF pour créer les cartes d'étalonnage ((AoLP) et (DoLP)), qui peuvent être combinées en une seule carte d'étalonnage (DoLP, AoLP). Ces cartes sont appliquées aux images AoLP et DoLP pour calculer une matrice de normales de surface, qui sont ensuite mises en correspondance afin de former une image en 3D de l'objet.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
EP3371548