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1. (WO2017111072) DIAGNOSTIC DEVICE, COMPUTER PROGRAM, AND DIAGNOSTIC SYSTEM
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/111072 International Application No.: PCT/JP2016/088471
Publication Date: 29.06.2017 International Filing Date: 22.12.2016
IPC:
G05B 23/02 (2006.01) ,G01H 17/00 (2006.01) ,G01M 99/00 (2011.01)
G PHYSICS
05
CONTROLLING; REGULATING
B
CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
23
Testing or monitoring of control systems or parts thereof
02
Electric testing or monitoring
G PHYSICS
01
MEASURING; TESTING
H
MEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
17
Measuring mechanical vibrations or ultrasonic, sonic or infrasonic waves, not provided for in the other groups of this subclass
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
99
Subject matter not provided for in other groups of this subclass
Applicants:
RICOH COMPANY, LTD. [JP/JP]; 3-6, Nakamagome 1-chome, Ohta-ku, Tokyo 1438555, JP (AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BE, BF, BG, BH, BJ, BN, BR, BW, BY, BZ, CA, CF, CG, CH, CI, CL, CM, CN, CO, CR, CU, CY, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, FR, GA, GB, GD, GE, GH, GM, GN, GQ, GR, GT, GW, HN, HR, HU, ID, IE, IL, IN, IR, IS, IT, KE, KG, KH, KM, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LT, LU, LV, LY, MA, MC, MD, ME, MG, MK, ML, MN, MR, MT, MW, MX, MY, MZ, NA, NE, NG, NI, NL, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SI, SK, SL, SM, SN, ST, SV, SY, SZ, TD, TG, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, UZ, VC, VN, ZA, ZM, ZW)
FUKUDA, Hiroaki [JP/JP]; JP (US)
SHIRATA, Yasunobu [JP/JP]; JP (US)
MURAMOTO, Yohsuke [JP/JP]; JP (US)
TAKAMI, Junichi [JP/JP]; JP (US)
Inventors:
FUKUDA, Hiroaki; JP
SHIRATA, Yasunobu; JP
MURAMOTO, Yohsuke; JP
TAKAMI, Junichi; JP
Agent:
SAKAI, Hiroaki; JP
Priority Data:
2015-25404125.12.2015JP
2016-21714407.11.2016JP
Title (EN) DIAGNOSTIC DEVICE, COMPUTER PROGRAM, AND DIAGNOSTIC SYSTEM
(FR) DISPOSITIF DE DIAGNOSTIC, PROGRAMME INFORMATIQUE ET SYSTÈME DE DIAGNOSTIC
Abstract:
(EN) A diagnostic device includes a reception unit and a determination unit. The reception unit is configured to receive context information and sensing information. The context information corresponds to a certain operation of a target item that constitutes a target device. The context information is a piece of a plurality of pieces of context information each describing an operation of the target item determined depending on a type of operation of the target device. The sensing information is on a physical quantity that varies in accordance with the operation of the target item. The determination unit is configured to determine a state of the target item based on the sensing information detected while the target item is performing the certain operation, and based on a model corresponding to the received context information. The model is a model of one or more models respectively defined for one or more pieces of the context information.
(FR) Le dispositif de diagnostic de l’invention comprend une unité de réception et une unité de détermination. L’unité de réception est conçue pour recevoir des informations de contexte et des informations de détection. Les informations de contexte correspondent à une certaine opération d’un élément cible qui constitue un dispositif cible. Les informations de contexte constituent un morceau d’une pluralité de morceaux d’informations de contexte décrivant chacun une opération de l’élément cible déterminée d’après un type d’opération du dispositif cible. Les informations de détection portent sur une quantité physique qui varie en fonction de l’opération de l’élément cible. L’unité de détermination est conçue pour déterminer un état de l’élément cible à partir des informations de détection détectées pendant que l’élément cible effectue ladite une certaine opération, et à partir d’un modèle correspondant aux informations de contexte reçues. Le modèle est un modèle parmi un ou plusieurs modèles définis pour un ou plusieurs morceaux des informations de contexte.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)
Also published as:
JP2017120622JP2017157234KR1020180084980CN108475052EP3394693US20180356282