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1. (WO2017111004) DEFORMATION SENSOR
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/111004 International Application No.: PCT/JP2016/088351
Publication Date: 29.06.2017 International Filing Date: 22.12.2016
IPC:
G01B 7/16 (2006.01) ,G01D 5/14 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
7
Measuring arrangements characterised by the use of electric or magnetic means
16
for measuring the deformation in a solid, e.g. by resistance strain gauge
G PHYSICS
01
MEASURING; TESTING
D
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; TRANSFERRING OR TRANSDUCING ARRANGEMENTS NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
5
Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
12
using electric or magnetic means
14
influencing the magnitude of a current or voltage
Applicants:
国立研究開発法人産業技術総合研究所 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY [JP/JP]; 東京都千代田区霞が関1丁目3番1号 3-1, Kasumigaseki 1-chome, Chiyoda-ku, Tokyo 1008921, JP
三井化学東セロ株式会社 MITSUI CHEMICALS TOHCELLO, INC. [JP/JP]; 東京都千代田区神田美土代町7 7, Kanda Mitoshiro-cho, Chiyoda-ku, Tokyo 1018485, JP
Inventors:
安積 欣志 ASAKA, Kinji; JP
堀内 哲也 HORIUCHI, Tetsuya; JP
朱 子才 ZHU, Zicai; JP
高瀬 三男 TAKASE, Mitsuo; JP
Agent:
特許業務法人三枝国際特許事務所 SAEGUSA & PARTNERS; 大阪府大阪市中央区道修町1-7-1 北浜TNKビル Kitahama TNK Building, 1-7-1, Doshomachi, Chuo-ku, Osaka-shi, Osaka 5410045, JP
Priority Data:
2015-25391125.12.2015JP
Title (EN) DEFORMATION SENSOR
(FR) CAPTEUR DE DÉFORMATION
(JA) 変形センサー
Abstract:
(EN) The present invention pertains to a deformation sensor characterized by having a structure in which an ion-conductive polymer layer is sandwiched by flexible electrodes, the deformation sensor being configured such that deformation generates a non-uniform ion distribution in the ion-conductive polymer layer and generates a difference in potential between the two electrodes.
(FR) La présente invention concerne un capteur de déformation caractérisé en ce qu'il présente une structure dans laquelle des électrodes flexibles se trouvent de part et d'autre d'une couche de polymère conducteur d'ions, le capteur de déformation étant conçu de telle sorte que la déformation génère une distribution non uniforme d'ions dans la couche de polymère conducteur d'ions et génère une différence de potentiel entre les deux électrodes.
(JA) 本発明は、イオン導電性高分子層を柔軟な電極で挟んだ構造を有し、変形によりイオン導電性高分子層内に不均一なイオン分布が生じて、電極間に電位差が生じることを特徴とする、変形センサーに関する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
CN108369085KR1020180097658EP3396305US20190003818