Search International and National Patent Collections
Some content of this application is unavailable at the moment.
If this situation persists, please contact us atFeedback&Contact
1. (WO2017110508) RADIATION DETECTION DEVICE, RADIATION TESTING SYSTEM, AND METHOD FOR ADJUSTING RADIATION DETECTION DEVICE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/110508 International Application No.: PCT/JP2016/086586
Publication Date: 29.06.2017 International Filing Date: 08.12.2016
IPC:
G01T 7/00 (2006.01) ,G01N 23/087 (2006.01) ,G01N 23/18 (2006.01) ,G01T 1/20 (2006.01)
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
7
Details of radiation-measuring instruments
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
06
and measuring the absorption
08
using electric detection means
083
the radiation being X-rays
087
using polyenergetic X-rays
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
06
and measuring the absorption
08
using electric detection means
18
Investigating the presence of flaws or inclusions
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
20
with scintillation detectors
Applicants:
浜松ホトニクス株式会社 HAMAMATSU PHOTONICS K.K. [JP/JP]; 静岡県浜松市東区市野町1126番地の1 1126-1, Ichino-cho, Higashi-ku, Hamamatsu-shi, Shizuoka 4358558, JP
Inventors:
大西 達也 ONISHI Tatsuya; JP
Agent:
長谷川 芳樹 HASEGAWA Yoshiki; JP
黒木 義樹 KUROKI Yoshiki; JP
柴山 健一 SHIBAYAMA Kenichi; JP
Priority Data:
2015-24865121.12.2015JP
Title (EN) RADIATION DETECTION DEVICE, RADIATION TESTING SYSTEM, AND METHOD FOR ADJUSTING RADIATION DETECTION DEVICE
(FR) DISPOSITIF DE DÉTECTION DE RAYONNEMENT, SYSTÈME DE TEST DE RAYONNEMENT, ET PROCÉDÉ DE RÉGLAGE DE DISPOSITIF DE DÉTECTION DE RAYONNEMENT
(JA) 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法
Abstract:
(EN) An X-ray detection device 10 for detecting X-rays that have passed through a test subject is equipped with: a filter 50 that attenuates some transmitted X-rays; a detection unit 20 for detecting the transmitted X-rays, some of which have been attenuated by the filter 50; a housing 30; and a holder 40 that has one slit 42. The detection unit 20 has a line sensor 21 and a line sensor 22 positioned near the line sensor 21 and so as to be parallel thereto. The holder 40 holds the filter 50 in a prescribed location in a manner such that the filter 50 covers part of the slit 42, and the line sensor 22 detects the X-rays that are attenuated by the filter 50.
(FR) L'invention concerne un dispositif de détection de rayons X (10) pour détecter des rayons X qui sont passés à travers un sujet de test, qui comprend : un filtre (50) qui atténue certains rayons X transmis ; une unité de détection (20) pour détecter les rayons X transmis, dont certains ont été atténués par le filtre (50) ; un boîtier (30) ; et un support (40) ayant une fente (42). L'unité de détection (20) comprend un capteur de ligne (21) et un capteur de ligne (22) placé à proximité du capteur de ligne (21) et de manière à être parallèle à ce dernier. Le support (40) porte le filtre (50) dans un emplacement prescrit d'une manière telle que le filtre (50) recouvre une partie de la fente (42), et le capteur de ligne (22) détecte les rayons X qui sont atténués par le filtre (50).
(JA) X線検出装置10は、検査対象物を透過したX線を検出する装置であって、透過X線の一部を減衰させるフィルタ50と、フィルタ50により一部が減衰された透過X線を検出する検出部20と、筐体30と、1つのスリット42を有するホルダ40とを備えている。検出部20は、ラインセンサ21と、ラインセンサ21と近接して並列に配置されるラインセンサ22とを有する。ホルダ40は、フィルタ50がスリット42の一部を覆うように、フィルタ50を所定の位置に保持し、ラインセンサ22がフィルタ50によって減衰されたX線を検出する。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
CN108474753EP3396419US20190003990