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1. (WO2017110507) RADIATION DETECTION DEVICE, RADIATION TESTING SYSTEM, AND METHOD FOR ADJUSTING RADIATION DETECTION DEVICE
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/110507 International Application No.: PCT/JP2016/086585
Publication Date: 29.06.2017 International Filing Date: 08.12.2016
IPC:
G01N 23/04 (2006.01) ,G01N 23/083 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
04
and forming a picture
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
06
and measuring the absorption
08
using electric detection means
083
the radiation being X-rays
Applicants:
浜松ホトニクス株式会社 HAMAMATSU PHOTONICS K.K. [JP/JP]; 静岡県浜松市東区市野町1126番地の1 1126-1, Ichino-cho, Higashi-ku, Hamamatsu-shi, Shizuoka 4358558, JP
Inventors:
大西 達也 ONISHI Tatsuya; JP
Agent:
長谷川 芳樹 HASEGAWA Yoshiki; JP
黒木 義樹 KUROKI Yoshiki; JP
柴山 健一 SHIBAYAMA Kenichi; JP
Priority Data:
2015-24865021.12.2015JP
Title (EN) RADIATION DETECTION DEVICE, RADIATION TESTING SYSTEM, AND METHOD FOR ADJUSTING RADIATION DETECTION DEVICE
(FR) DISPOSITIF DE DÉTECTION DE RAYONNEMENT, SYSTÈME DE TEST DE RAYONNEMENT, ET PROCÉDÉ DE RÉGLAGE DE DISPOSITIF DE DÉTECTION DE RAYONNEMENT
(JA) 放射線検出装置、放射線検査システム、及び、放射線検出装置の調整方法
Abstract:
(EN) An X-ray detection device 10 for detecting X-rays that have passed through a test subject is equipped with: a filter member 40 having a filter 42 that attenuates some X-rays; a detection unit 20 for detecting X-rays, some of which have been attenuated by the filter 42; and a housing 30 for housing the detection unit 20 in the interior thereof. The housing 30 has a principal surface 32 that includes a slit 31 through which X-rays can pass, and a lateral surface 34 that extends in a direction perpendicular to the principal surface 32, and includes an opening 35 through which the filter 42 can be laterally inserted. The filter 42 of the filter member 40 is positioned inside the housing 30 so as to cover a scintillator 25 and a line sensor 22 of the detection unit 20 while being separated from the detection unit 20.
(FR) L'invention concerne un dispositif de détection de rayons X (10) permettant de détecter des rayons X qui sont passés à travers un sujet de test, qui comprend : un élément de filtre (40) ayant un filtre (42) qui atténue certains rayons X ; une unité de détection (20) permettant de détecter des rayons X, dont certains ont été atténués par le filtre (42) ; et un logement (30) servant à loger l'unité de détection (20) à l'intérieur de ce dernier. Le logement (30) possède une surface principale (32) qui comprend une fente (31) à travers laquelle des rayons X peuvent passer, et une surface latérale (34) qui s'étend dans une direction perpendiculaire à la surface principale (32) et comporte une ouverture (35) à travers laquelle le filtre (42) peut être inséré latéralement. Le filtre (42) de l'élément de filtre (40) est placé à l'intérieur du logement (30) de façon à recouvrir un scintillateur (25) et un capteur de ligne (22) de l'unité de détection (20) tout en étant séparé de l'unité de détection (20).
(JA) X線検出装置10は、検査対象物を透過したX線を検出する装置であって、X線の一部を減衰させるフィルタ42を有するフィルタ部材40と、フィルタ42により一部が減衰されたX線を検出する検出部20と、検出部20を内部に収納する筐体30とを備えている。筐体30は、X線が通過可能なスリット31を含む主面32と、主面32と直交する方向に延在しフィルタ42を横から挿入可能な開口35を含む側面34とを有する。フィルタ部材40のフィルタ42は、検出部20から離れた状態で検出部20のラインセンサ22及びシンチレータ25を覆うように筐体30の内部に配置されている。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)
Also published as:
CN108474754EP3396362US20180364370