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1. (WO2017092136) QUICK MEASUREMENT METHOD FOR BLADE SURFACE MICROSTRUCTURE BASED ON LIGHT INTERFERENCE TECHNOLOGY
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/092136 International Application No.: PCT/CN2015/099648
Publication Date: 08.06.2017 International Filing Date: 30.12.2015
IPC:
G01N 21/45 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
41
Refractivity; Phase-affecting properties, e.g. optical path length
45
using interferometric methods; using Schlieren methods
Applicants:
江苏大学 JIANGSU UNIVERSITY [CN/CN]; 中国江苏省镇江市 学府路301号 No.301, Xuefu Road Zhenjiang County, Jiangsu 212013, CN
Inventors:
李青林 LI, Qinglin; CN
毛罕平 MAO, Hanping; CN
左志宇 ZUO, Zhiyu; CN
倪纪恒 NI, Jiheng; CN
孙俊 SUN, Jun; CN
张晓东 ZHANG, Xiaodong; CN
Agent:
北京德崇智捷知识产权代理有限公司 JW IP LAW FIRM; 中国北京市 朝阳区酒仙桥路14号A5楼7层701 Room 701, Floor 7, Building A5, No.14 Courtyard, Jiuxianqiao Road,, Chaoyang District Beijing 100015, CN
Priority Data:
201510852183.430.11.2015CN
Title (EN) QUICK MEASUREMENT METHOD FOR BLADE SURFACE MICROSTRUCTURE BASED ON LIGHT INTERFERENCE TECHNOLOGY
(FR) PROCÉDÉ DE MESURE RAPIDE DE MICROSTRUCTURE DE SURFACE D'AUBE BASÉ SUR UNE TECHNOLOGIE D'INTERFÉRENCE LUMINEUSE
(ZH) 一种基于光干涉技术的叶片表面微结构快速测量方法
Abstract:
(EN) A quick measurement method for a blade surface microstructure based on light interference technology. The micro-morphologic characteristics of a blade surface are obtained using an optical measurement method instead of scanning electron microscope technology and are quantitatively characterized, so that the problems that the characteristics of the blade surface cannot be directly and quickly obtained and quantitatively characterized are solved. The method has the advantages of quickness, simplicity, easiness, capability of performing quantitative analysis and the like, and can be applied to the quick measurement of a blade surface microstructure.
(FR) L'invention concerne un procédé de mesure rapide pour une microstructure de surface d'aube, basé sur une technologie d'interférence de lumière. Les caractéristiques micro-morphologiques d'une surface d'aube sont obtenues à l'aide d'un procédé de mesure optique au lieu d'une technologie de microscope électronique à balayage et sont caractérisées de manière quantitative, de telle sorte que les problèmes selon lesquels les caractéristiques de la surface d'aube ne peuvent pas être obtenues directement et rapidement et quantitativement sont résolus. Le procédé présente les avantages d'une rapidité, d'une simplicité, d'une facilité, d'une capacité d'effectuer une analyse quantitative et analogues, et peut être appliqué à la mesure rapide d'une microstructure de surface d'aube.
(ZH) 一种基于光干涉技术的叶片表面微结构快速测量方法,采用光学测量方法代替扫描电镜技术获取叶片表面的微观形态特征,并加以定量表征,解决了叶片表面特征无法直接快速获取、定量进行表征的问题,具有快速、简单易行、可以定量分析等优点,可应用于叶片表面微结构快速测量。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Chinese (ZH)
Filing Language: Chinese (ZH)