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1. (WO2017090871) AXIAL OFFSET MEASURING APPARATUS USING PARALLEL BEAMS
Latest bibliographic data on file with the International Bureau

Pub. No.: WO/2017/090871 International Application No.: PCT/KR2016/010068
Publication Date: 01.06.2017 International Filing Date: 08.09.2016
IPC:
G01B 11/27 (2006.01) ,G02B 26/10 (2006.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
26
for measuring angles or tapers; for testing the alignment of axes
27
for testing the alignment of axes
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
26
Optical devices or arrangements using movable or deformable optical elements for controlling the intensity, colour, phase, polarisation or direction of light, e.g. switching, gating, modulating
08
for controlling the direction of light
10
Scanning systems
Applicants:
주식회사 선진기술 ADVANCEMENT TECHNOLOGY CO., LTD [KR/KR]; 경상남도 창원시 의창구 창원대로 20, 82331(창원보육센터 제17창업실) (Changwon incubation center 17Changupsil) 82331, 20, Changwondaehak-ro, Uichang-gu, Changwon-si, Gyeongsangnam-do 51140, KR
Inventors:
이우송 LEE, Woosong; KR
김병창 KIM, Byungchang; KR
Agent:
특허법인 남촌 NAMCHON PATENT & LAW FIRM; 경상남도 창원시 의창구 창원대로18번길 46, 717호 (팔용동) (Paryong-dong) #717, 46, Changwon-daero 18beon-gil, Uichang-gu, Changwon-si, Gyeongsangnam-do 51395, KR
Priority Data:
10-2015-016603426.11.2015KR
Title (EN) AXIAL OFFSET MEASURING APPARATUS USING PARALLEL BEAMS
(FR) APPAREIL DE MESURE DE DÉCALAGE AXIAL UTILISANT DES FAISCEAUX PARALLÈLES
(KO) 평행광을 이용한 축오차 측정장치
Abstract:
(EN) The present invention relates to a novel axial offset measuring apparatus using parallel beams, the apparatus comprising a light source unit, a microlens array, a photographing device unit, and a controller and, specifically, enabling the photographing device unit to photograph, as a plurality of spots, the parallel beams irradiated from the light source unit through the additional provision of the microlens array, and enabling a straightness error, a flatness error, and a rotation error of a moving device unit to be quantitatively calculated through the continuous calculation of the displacement of the plurality of spots.
(FR) La présente invention concerne un nouvel appareil de mesure de décalage axial utilisant des faisceaux parallèles, l'appareil comprenant une unité de source de lumière, un réseau de microlentilles, une unité de dispositif de photographie, et un contrôleur et, en particulier, permettant à l'unité de dispositif de photographie de photographier, en tant que pluralité de points, les faisceaux parallèles rayonnés depuis l'unité de source de lumière par la fourniture additionnelle du réseau de microlentilles, et permettant à une erreur de rectitude, une erreur de planéité, et une erreur de rotation d'une unité de dispositif mobile d'être calculées de manière quantitative par le calcul en continu du déplacement de la pluralité de points.
(KO) 본 발명은 광원부와, 마이크로렌즈 어레이와, 촬영기구부와, 컨트롤러를 포함하여 이루어지며, 특히 상기 마이크로렌즈 어레이의 추가적인 제공을 통해 광원부로부터 조사되는 평행광이 다수의 스팟으로 촬영기구부에 촬영될 수 있도록 하고, 이러한 다수의 스팟에 대한 연속적인 변위 계산을 통해 운동기구부에 대한 직진도오차와 평탄도오차 및 회전오차가 정량적으로 산출할 수 있도록 한 새로운 형태의 평행광을 이용한 축오차 측정장치이다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)