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1. (WO2017069441) APPARATUS FOR PANEL SURFACE INSPECTION
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Pub. No.: WO/2017/069441 International Application No.: PCT/KR2016/011315
Publication Date: 27.04.2017 International Filing Date: 10.10.2016
IPC:
G01N 21/958 (2006.01) ,G01N 21/88 (2006.01) ,G06T 7/00 (2017.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
95
characterised by the material or shape of the object to be examined
958
Inspecting transparent materials
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
T
IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
7
Image analysis, e.g. from bit-mapped to non bit-mapped
Applicants:
주식회사 영우디에스피 YOUNGWOO DSP CO., LTD. [KR/KR]; 충청남도 천안시 서북구 성거읍 새터길 164 164, Saeteo-gil, Seonggeo-eup Seobuk-gu, Cheonan-si Chungcheongnam-do 31042, KR
Inventors:
박금성 PARK, Geum Sung; KR
김기순 KIM, Kee Soon; KR
이길휘 LEE, Gil Hwi; KR
Agent:
박문수 PARK, Moon Su; KR
Priority Data:
10-2015-014552419.10.2015KR
Title (EN) APPARATUS FOR PANEL SURFACE INSPECTION
(FR) APPAREIL D'INSPECTION DE SURFACE DE PANNEAU
(KO) 패널 표면 검사장치
Abstract:
(EN) The present invention relates to an apparatus for panel surface inspection which captures three-dimensional images of panel surface defects such as indentation impressions or foreign materials attached, thereby enabling rapid and precise inspection. The present invention provides an apparatus for panel surface inspection comprising: a stage (100) on which a panel to be inspected is placed horizontally; a camera (200) installed above the center of the stage; and an upper lighting (300) installed between the stage and the camera, wherein the upper lighting comprises light-emitting channels (320) comprising multiple light-emitting elements (L) disposed at predetermined intervals on a flat surface parallel to the panel, the light-emitting channels are disposed at predetermined intervals and in multiple columns and rows and turned on and off sequentially, thereby illuminating segments of the panel surface, and the camera captures images every time the light-emitting channels are turned on.
(FR) La présente invention se rapporte à un appareil d'inspection de surface de panneau qui capture des images en trois dimensions de défauts de surface de panneau tels que des impressions d'indentation ou des matières étrangères fixées, ce qui permet une inspection rapide et précise. La présente invention concerne un appareil d'inspection de surface de panneau comprenant : une platine (100) sur laquelle un panneau à inspecter est placé horizontalement; un appareil de prise de vues (200) installé au-dessus du centre de la platine; et un éclairage supérieur (300) installé entre la platine et l'appareil de prise de vues, l'éclairage supérieur comprenant des canaux d'émission de lumière (320) comprenant de multiples éléments d'émission de lumière (L) disposés à des intervalles prédéterminés sur une surface plane parallèle au panneau, les canaux d'émission de lumière étant disposés à des intervalles prédéterminés et en plusieurs colonnes et rangées et allumés et éteints séquentiellement, ce qui éclaire ainsi des segments de la surface de panneau, et l'appareil de prise de vues capturant des images à chaque fois que les canaux d'émission de lumière sont allumés.
(KO) 본 발명은 패널의 표면에 발생된 압흔이나 이물부착 등의 불량 여부를 입체적으로 촬영하여 신속하고 정밀한 검사가 이루어지도록 한 패널 표면 검사장치에 관한 것이다. 본 발명은 검사대상이 되는 패널이 수평상태로 놓여지는 스테이지(100)와, 상기 스테이지의 중앙에 상부로 이격되게 설치된 카메라(200)와, 상기 스테이지와 카메라와 사이에 설치된 상부조명(300)을 구비한 패널 표면 검사장치에 있어서, 상기 상부조명은 패널과 평행한 평면상에 일정간격을 두고 배치된 다수의 발광소자(L)들로 이루어진 발광채널(320)들을 구비하며, 상기 발광채널들은 일정간격을 두고 다열 다행으로 배치되어 순차적으로 점멸되면서 패널의 표면을 분할조명하고, 상기 카메라는 발광채널이 점등될 때마다 촬영을 수행하도록 구성된다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)