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Machine translation
1. (WO2017061706) LASER MARKING SYSTEM AND LASER MARKING METHOD USING SAME
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2017/061706    International Application No.:    PCT/KR2016/010049
Publication Date: 13.04.2017 International Filing Date: 08.09.2016
IPC:
H01L 21/67 (2006.01), B23K 26/00 (2014.01), B23K 26/067 (2006.01), B23K 26/40 (2014.01), H01L 23/544 (2006.01), B23K 103/00 (2006.01)
Applicants: EO TECHNICS CO.,LTD. [KR/KR]; 91, Dongpyeon-ro Dongan-gu, Anyang-si, Gyeonggi-do 13930 (KR)
Inventors: HYUN, Byung Hun; (KR).
KIM, Tae Jung; (KR).
SHIN, Dong Joon; (KR).
HWANG, Yoon Sung; (KR)
Agent: Y.P.LEE, MOCK & PARTNERS; 12F Daelim Acrotel, 13 Eonju-ro 30-gil Gangnam-gu, Seoul 06292 (KR)
Priority Data:
10-2015-0141048 07.10.2015 KR
Title (EN) LASER MARKING SYSTEM AND LASER MARKING METHOD USING SAME
(FR) SYSTÈME DE MARQUAGE LASER ET PROCÉDÉ DE MARQUAGE LASER L'UTILISANT
(KO) 레이저 마킹 시스템 및 이를 이용한 레이저 마킹 방법
Abstract: front page image
(EN)Disclosed are a laser marking system and a laser marking method. The disclosed laser marking system comprises: a laser oscillator; a beam splitter for dividing a laser beam emitted from the laser oscillator into first and second marking laser beams; first and second beam control units, which are disposed in movement paths of the first and second marking laser beams and have refractive indices changing according to changes in voltages applied thereto, so as to control characteristics of the first and second marking laser beams; and first and second Galvano scanners for controlling directions of the first and second marking laser beams which have passed through the first and second beam control units.
(FR)L'invention concerne un système de marquage laser et un procédé de marquage laser. Le système de marquage laser décrit comprend : un oscillateur laser ; un diviseur de faisceau pour diviser un faisceau laser émis par l'oscillateur laser en des premier et second faisceaux laser de marquage ; des première et seconde unités de commande de faisceau, qui sont disposées dans des chemins de propagation des premier et second faisceaux laser de marquage et possèdent des indices de réfraction qui varient en fonction de variations de tensions qui leur sont appliquées, de manière à commander des caractéristiques des premier et second faisceaux laser de marquage ; et des premier et second dispositifs de balayage galvanique pour commander des directions des premier et second faisceaux laser de marquage qui sont passés à travers les première et seconde unités de commande de faisceau.
(KO)레이저 마킹 시스템 및 마킹 방법이 개시된다. 개시된 레이저 마킹 시스템은, 레이저 발진기; 상기 레이저 발진기에서 출사된 레이저빔을 제1, 제2 마킹 레이저빔으로 분할하는 빔 스플리터; 상기 제1, 제2 마킹 레이저빔의 이동 경로에 배치되며, 인가되는 전압의 변화에 따라 굴절률이 변하여, 제1, 제2 마킹 레이저빔의 특성을 제어하는, 제1, 제2 빔 제어부; 및 상기 제1, 제2 빔 제어부를 통과한 제1, 제2 마킹 레이저 빔의 방향을 제어하는 제1, 제2 갈바노 스캐너;를 포함한다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)