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1. (WO2017061619) SPECIMEN TREATMENT CHIP, SPECIMEN TREATMENT DEVICE, AND SPECIMEN TREATMENT METHOD
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Pub. No.: WO/2017/061619 International Application No.: PCT/JP2016/080008
Publication Date: 13.04.2017 International Filing Date: 07.10.2016
Chapter 2 Demand Filed: 09.08.2017
IPC:
G01N 35/08 (2006.01) ,C12M 1/00 (2006.01) ,C12M 1/34 (2006.01) ,G01N 37/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
08
using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
C CHEMISTRY; METALLURGY
12
BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
M
APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY
1
Apparatus for enzymology or microbiology
C CHEMISTRY; METALLURGY
12
BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
M
APPARATUS FOR ENZYMOLOGY OR MICROBIOLOGY
1
Apparatus for enzymology or microbiology
34
Measuring or testing with condition measuring or sensing means, e.g. colony counters
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
37
Details not covered by any other group of this subclass
Applicants:
シスメックス株式会社 SYSMEX CORPORATION [JP/JP]; 兵庫県神戸市中央区脇浜海岸通1丁目5番1号 5-1, Wakinohama-Kaigandori 1-chome, Chuo-ku, Kobe-shi, Hyogo 6510073, JP
Inventors:
田川 礼人 TAGAWA, Ayato; JP
中野 毅 NAKANO, Tsuyoshi; JP
川本 泰子 KAWAMOTO, Yasuko; JP
山脇 幸也 YAMAWAKI, Koya; JP
飛松 弘晃 TOBIMATSU, Hiroaki; JP
Agent:
宮園 博一 MIYAZONO, Hirokazu; JP
Priority Data:
2015-20076709.10.2015JP
Title (EN) SPECIMEN TREATMENT CHIP, SPECIMEN TREATMENT DEVICE, AND SPECIMEN TREATMENT METHOD
(FR) PUCE DE TRAITEMENT D’ÉCHANTILLON, DISPOSITIF DE TRAITEMENT D’ÉCHANTILLON, ET PROCÉDÉ DE TRAITEMENT D’ÉCHANTILLON
(JA) 検体処理チップ、検体処理装置および検体処理方法
Abstract:
(EN) This specimen treatment chip comprises: a first fluid module including a first flow path for executing a first treatment step with respect to a target component in a specimen; a second fluid module including a second flow path for executing a second treatment step with respect to the target component that has been subjected to the first treatment step; a substrate; and a connection flow path for connecting the first fluid module and the second fluid module, the connection flow path being arranged in the substrate.
(FR) L'invention concerne une puce de traitement d'échantillon qui comprend : un premier module de fluide comprenant un premier trajet d'écoulement pour exécuter une première étape de traitement par rapport à un élément cible dans un échantillon ; un second module de fluide comprenant un second trajet d'écoulement pour exécuter une seconde étape de traitement par rapport à l'élément cible qui a été soumis à la première étape de traitement ; un substrat ; et un trajet d'écoulement de raccordement pour relier le premier module de fluide et le second module de fluide, le trajet d'écoulement de raccordement étant agencé dans le substrat.
(JA) この検体処理チップは、検体中の対象成分に対して、第1処理工程を実行するための第1流路を備える第1流体モジュールと、第1処理工程が実行された対象成分に対して、第2処理工程を実行するための第2流路を備える第2流体モジュールと、基板と、基板に配置された第1流体モジュールと第2流体モジュールとを接続するための接続流路とを備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)