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1. (WO2017057737) FOREIGN-MATTER INSPECTION DEVICE
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Pub. No.: WO/2017/057737 International Application No.: PCT/JP2016/079137
Publication Date: 06.04.2017 International Filing Date: 30.09.2016
IPC:
G01N 23/04 (2006.01) ,G01N 23/18 (2006.01) ,G01N 27/72 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
04
and forming a picture
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
02
by transmitting the radiation through the material
06
and measuring the absorption
08
using electric detection means
18
Investigating the presence of flaws or inclusions
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
72
by investigating magnetic variables
Applicants:
株式会社イシダ ISHIDA CO., LTD. [JP/JP]; 京都府京都市左京区聖護院山王町44番地 44 Sanno-cho, Shogoin, Sakyo-ku, Kyoto-shi, Kyoto 6068392, JP
日新電子工業株式会社 NISSIN ELECTRONICS CO., LTD. [JP/JP]; 東京都江東区亀戸1-29-13 1-29-13, Kameido, Koto-ku, Tokyo 1360071, JP
Inventors:
八重樫 卓也 YAEGASHI Takuya; JP
田中 孝幸 TANAKA Takayuki; JP
Agent:
長谷川 芳樹 HASEGAWA Yoshiki; JP
黒木 義樹 KUROKI Yoshiki; JP
柴山 健一 SHIBAYAMA Kenichi; JP
Priority Data:
2015-19590201.10.2015JP
Title (EN) FOREIGN-MATTER INSPECTION DEVICE
(FR) DISPOSITIF D'INSPECTION DE MATIÈRE ÉTRANGÈRE
(JA) 異物検査装置
Abstract:
(EN) This foreign-matter inspection device comprises: a transporting unit that transports an object to be inspected; an X-ray inspection unit that, by utilizing the permeability of X-rays, detects foreign matters included in the object to be inspected being transported by the transporting unit; a metal detection unit that, by utilizing interaction between a magnetic field and metal, detects foreign matters included in the object to be inspected being transported by the transporting unit; and a housing that houses therein the X-ray inspection unit, the metal detection unit, and at least a portion of the transporting unit, and that keeps the X-rays of the X-ray inspection unit from leaking outside. The housing is provided with a door part for opening and closing the housing. In a closed state, the door part abuts against the housing with an insulating body therebetween.
(FR) L'invention concerne un dispositif d'inspection de matière étrangère, qui comprend : une unité de transport qui transporte un objet à inspecter ; une unité d'inspection à rayons X qui, en utilisant la perméabilité de rayons X, détecte des matières étrangères comprises dans l'objet à inspecter transporté par l'unité de transport ; une unité de détection de métal qui, en utilisant une interaction entre un champ magnétique et un métal, détecte des matières étrangères incluses dans l'objet à inspecter transporté par l'unité de transport ; et un boîtier qui loge, à l'intérieur de ce dernier, l'unité d'inspection à rayons X, l'unité de détection de métal et au moins une partie de l'unité de transport, et qui empêche les rayons X de l'unité d'inspection à rayons X de fuir à l'extérieur. Le boîtier comprend une partie de porte pour ouvrir et fermer le boîtier. Dans un état fermé, la partie de porte vient en butée contre le boîtier avec un corps isolant entre eux.
(JA) 異物検査装置は、被検査物を搬送する搬送部と、X線の透過性を利用して、搬送部で搬送されている被検査物に含まれる異物を検出するX線検査部と、磁界と金属との相互作用を利用して、搬送部で搬送されている被検査物に含まれる異物を検出する金属検出部と、搬送部の少なくとも一部、X線検査部、及び金属検出部を内部に収容し、X線検査部のX線の外部漏洩を抑制する筐体と、を備える。筐体には、当該筐体を開閉する扉部が設けられている。扉部は、閉状態において、筐体に対して絶縁体を介して当接している。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)