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1. (WO2017057356) STRUCTURE IMAGING APPARATUS, STRUCTURE INSPECTION APPARATUS, AND STRUCTURE INSPECTION SYSTEM
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Pub. No.: WO/2017/057356 International Application No.: PCT/JP2016/078444
Publication Date: 06.04.2017 International Filing Date: 27.09.2016
IPC:
G01N 21/88 (2006.01) ,E01C 23/01 (2006.01) ,E01D 22/00 (2006.01) ,G01N 21/84 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
E FIXED CONSTRUCTIONS
01
CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
C
CONSTRUCTION OF, OR SURFACES FOR, ROADS, SPORTS GROUNDS, OR THE LIKE; MACHINES OR AUXILIARY TOOLS FOR CONSTRUCTION OR REPAIR
23
Auxiliary devices or arrangements for constructing, repairing, reconditioning, or taking-up road or like surfaces
01
Devices or auxiliary means for setting-out or checking the configuration of new surfacing, e.g. templates, screed supports; Applications of apparatus for measuring, indicating, or recording the surface configuration of existing surfacing, e.g. profilographs
E FIXED CONSTRUCTIONS
01
CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
D
BRIDGES
22
Methods or apparatus for repairing or strengthening existing bridges
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
Applicants: KURASHIKI BOSEKI KABUSHIKI KAISHA[JP/JP]; 7-1, Hommachi, Kurashiki-shi, Okayama 7100054, JP
Inventors: MIZOBE, Yoshiyuki; JP
YAMAMOTO, Minoru; JP
FUTAMURA, Takafusa; JP
Agent: ARC PATENT ATTORNEYS' OFFICE; 1-2, Sonezaki 1-chome, Kita-ku, Osaka-shi, Osaka 5300057, JP
Priority Data:
2015-18979228.09.2015JP
2015-18979328.09.2015JP
Title (EN) STRUCTURE IMAGING APPARATUS, STRUCTURE INSPECTION APPARATUS, AND STRUCTURE INSPECTION SYSTEM
(FR) APPAREIL D'IMAGERIE DE STRUCTURE, APPAREIL D'INSPECTION DE STRUCTURE ET SYSTÈME D'INSPECTION DE STRUCTURE
(JA) 構造物撮像装置、構造物検査装置および構造物検査システム
Abstract:
(EN) This structure imaging apparatus is provided with an imaging unit (11) for imaging an area to be imaged (40a) of a placement surface (40), a bending optical system (16) that bends the direction of imaging by the imaging unit (11), and a lighting unit (12a) that lights the area to be imaged (40a). This structure inspection apparatus is further provided with a position change detection unit (13) that detects a position change due to a movement on the placement surface (40), and an imaging timing control unit (14a) that controls timing of imaging by the imaging unit (11) on the basis of the position change detected by the position change detection unit (13).
(FR) La présente invention concerne un appareil d'imagerie de structure qui est pourvu d'une unité d'imagerie (11) destinée à imager une zone qui doit être imagée (40a), d'une surface de placement (40), d'un système optique pliant (16) qui fléchit la direction d'imagerie par l'unité d'imagerie (11), et d'une unité d'éclairage (12a) qui éclaire la zone qui doit être imagée (40a). Cet appareil d'inspection de structure est en outre pourvu d'une unité de détection de changement de position (13) qui détecte un changement de position dû à un mouvement sur la surface de placement (40), et d'une unité de commande de synchronisation d'imagerie (14a) qui commande la synchronisation d'imagerie par l'unité d'imagerie (11) sur la base du changement de position détecté par l'unité de détection de changement de position (13).
(JA) 構造物撮像装置は、載置面(40)上の被撮像領域(40a)を撮像するための撮像部(11)と、この撮像部(11)による撮像方向を屈曲する屈曲光学系(16)と、被撮像領域(40a)を照明する照明部(12a)とを備える。構造物検査装置は、載置面(40)上での移動による位置変化を検知する位置変化検知部(13)と、この位置変化検知部(13)によって検知された位置変化に基づいて撮像部(11)による撮像の時期を制御する撮像時期制御部(14a)とをさらに備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)