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1. (WO2017056879) CONTACTOR
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Pub. No.: WO/2017/056879 International Application No.: PCT/JP2016/076208
Publication Date: 06.04.2017 International Filing Date: 06.09.2016
IPC:
G01R 1/067 (2006.01) ,G01R 1/073 (2006.01) ,G01R 31/26 (2014.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1
Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02
General constructional details
06
Measuring leads; Measuring probes
067
Measuring probes
073
Multiple probes
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26
Testing of individual semiconductor devices
Applicants:
株式会社ヨコオ YOKOWO CO., LTD. [JP/JP]; 東京都北区滝野川7丁目5-11 5-11, Takinogawa 7-Chome, Kita-Ku, Tokyo 1148515, JP
Inventors:
永田 孝弘 NAGATA, Takahiro; JP
Agent:
村井 隆 MURAI, Takashi; JP
村井 弘実 MURAI, Hiromi; JP
Priority Data:
2015-19476830.09.2015JP
Title (EN) CONTACTOR
(FR) CONTACTEUR
(JA) コンタクタ
Abstract:
(EN) Provided is a contactor that is easy to produce and can ensure a long stroke. A contactor 1 is provided with: a flexible substrate 10; a plurality of contact sections 20 provided to the flexible substrate 10; a plurality of springs 30 that bias each contact section 20 toward a device 7 to be tested; and a housing 40 for accommodating the plurality of springs 30. The springs 30 each have a flat winding section 31 at least at the contact section 20-side end, and have a closely-wound diagonal winding section 32 in the middle in the length direction thereof. A gap G is present between the flat winding section 31 and the closely-wound diagonal winding section 32 in an open state.
(FR) La présente invention concerne un contacteur qui est facile à produire et peut assurer une longue course. Un contacteur (1) est pourvu : d'un substrat flexible (10) ; d'une pluralité de sections de contact (20) disposées sur le substrat flexible (10) ; d'une pluralité de ressorts (30) qui sollicitent chaque section de contact (20) vers un dispositif (7) qui doit être testé ; et d'un boîtier (40) destiné à recevoir la pluralité de ressorts (30). Les ressorts (30) comportent chacun une section d'enroulement plat (31) au moins au niveau de l'extrémité latérale de la section de contact (20) et comportent une section d'enroulement en diagonale étroitement enroulée (32) au milieu dans le sens de la longueur de cette dernière. Un espace (G) est présent entre la section d'enroulement plat (31) et la section d'enroulement en diagonale étroitement enroulée (32) dans un état ouvert.
(JA) 製造容易で長いストロークを確保することの可能なコンタクタを提供する。 コンタクタ1は、フレキシブル基板10と、フレキシブル基板10に設けられた複数の接点部20と、各々の接点部20を検査対象デバイス7に向けて付勢する複数のスプリング30と、複数のスプリング30を収容するハウジング40と、を備える。スプリング30は、少なくとも接点部20側の端部に平坦巻き部31を有し、かつ自身の長さ方向の中間部に斜め密着巻き部32を有し、開放状態において平坦巻き部31と斜め密着巻き部32との間に隙間Gが存在する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)