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1. (WO2017041480) DISPLAY SUBSTRATE, TESTING METHOD THEREFOR AND DISPLAY APPARATUS

Pub. No.:    WO/2017/041480    International Application No.:    PCT/CN2016/077344
Publication Date: Fri Mar 17 00:59:59 CET 2017 International Filing Date: Sat Mar 26 00:59:59 CET 2016
IPC: G02F 1/1333
G02F 1/13
Applicants: BOE TECHNOLOGY GROUP CO., LTD.
京东方科技集团股份有限公司
BEIJING BOE OPTOELECTRONICS TECHNOLOGY CO., LTD.
北京京东方光电科技有限公司
Inventors: LI, Yanchen
李彦辰
WANG, Panhua
王攀华
Title: DISPLAY SUBSTRATE, TESTING METHOD THEREFOR AND DISPLAY APPARATUS
Abstract:
A display substrate, a testing method therefor and a display apparatus. The display substrate comprises a plurality of pixel regions arranged in a matrix and a testing unit. Each of the pixel regions is provided with a first electrode. The testing unit comprises at least two sub-testing units. First electrodes provided in a plurality of adjacent pixel regions correspond to electrode blocks (1). The various electrode blocks (1) are electrically isolated from each other. The electrode blocks (1) are divided into at least two testing groups of the same number as that of sub-testing units according to arrangement positions. The electrode blocks (1) belonging to the same testing group are all arranged at intervals in a row direction and a column direction, and all the electrode blocks in the same testing group are connected to one of the sub-testing units. The testing unit can precisely test a bad open circuit or a bad short circuit in a display substrate, thereby improving the testing precision and reducing the production costs.