Search International and National Patent Collections

1. (WO2017041123) METHOD AND DEVICE FOR MONITORING A SEMICONDUCTOR MODULE

Pub. No.:    WO/2017/041123    International Application No.:    PCT/AT2016/050250
Publication Date: Fri Mar 17 00:59:59 CET 2017 International Filing Date: Wed Jul 20 01:59:59 CEST 2016
IPC: H05B 33/08
G01K 7/42
G01R 31/27
Applicants: MATERIALS CENTER LEOBEN FORSCHUNG GMBH
Inventors: DEFREGGER, Stefan
KRAKER, Elke
MÜCKE, Manfred
Title: METHOD AND DEVICE FOR MONITORING A SEMICONDUCTOR MODULE
Abstract:
The invention relates to a method for monitoring a semiconductor module, in particular an LED module, having the following steps: –generating a theoretical model (TM) of the semiconductor module, –measuring thermal impedances of the semiconductor module, –comparing the theoretical model (TM) with measurement values (MW), said theoretical model (TM) being validated using the measurement values (MW), and –generating a compact thermal model (KM) for representing a heat flow in the semiconductor module in order to monitor a state of the semiconductor module. The invention further relates to a device for monitoring a semiconductor module, in particular an LED module, comprising at least one circuit arrangement and at least one analysis unit. The at least one circuit arrangement and the at least one analysis unit are integrated into the semiconductor module, in particular into the LED module. The invention further relates to the use of such a device.