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1. (WO2017040316) SAMPLE ANALYSIS, PRESENCE DETERMINATION OF A TARGET SEQUENCE
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Pub. No.: WO/2017/040316 International Application No.: PCT/US2016/049071
Publication Date: 09.03.2017 International Filing Date: 26.08.2016
IPC:
C40B 30/04 (2006.01) ,C12Q 1/68 (2006.01)
[IPC code unknown for C40B 30/04][IPC code unknown for C12Q 1/68]
Applicants:
THE BROAD INSTITUTE, INC. [US/US]; 415 Main Street Cambridge, MA 02142, US
MASSACHUSETTS INSTITUTE OF TECHNOLOGY [US/US]; 77 Massachusetts Avenue Cambridge, MA 02139, US
PRESIDENT AND FELLOWS OF HARVARD COLLEGE [US/US]; US
Inventors:
METSKY, Hayden; US
GNIRKE, Andreas; US
MATRANGA, Christian; US
PARK, Daniel; US
SABETI, Pardis; US
Agent:
NIX, F., Brent; US
Priority Data:
62/211,54128.08.2015US
Title (EN) SAMPLE ANALYSIS, PRESENCE DETERMINATION OF A TARGET SEQUENCE
(FR) ANALYSE D'ÉCHANTILLON, DÉTERMINATION DE PRÉSENCE D'UNE SÉQUENCE CIBLE
Abstract:
(EN) The present invention provides a combination of genomic and computational technologies to provide rapid, portable sample analysis for sequencing or identifying a target sequence involving generating probes for use in analyzing a sample which may comprise a target sequence.
(FR) La présente invention concerne une combinaison de technologies de calcul et génomique de manière à obtenir rapidement, une analyse d'échantillon portable pour le séquençage ou l'identification d'une séquence cible impliquant la génération de sondes pour une utilisation dans l'analyse d'un échantillon qui peut comprendre une séquence cible.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)