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1. (WO2017039936) CONDUCTIVE TEMPERATURE CONTROL
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/039936 International Application No.: PCT/US2016/045475
Publication Date: 09.03.2017 International Filing Date: 04.08.2016
IPC:
G01R 1/04 (2006.01) ,G01R 31/28 (2006.01) ,G01K 1/16 (2006.01)
[IPC code unknown for G01R 1/04][IPC code unknown for G01R 31/28][IPC code unknown for G01K 1/16]
Applicants:
TERADYNE, INC. [US/US]; 600 Riverpark Drive North Reading, Massachusetts 01864, US
Inventors:
ORCHANIAN, Shant; US
CARVALHO, Valquirio N.; US
CAMPBELL, Philip; US
POLLACK, Matthew David; US
Agent:
PYSHER, Paul A.; US
AUGST, Alexander D.; US
BUTEAU, Kristen C.; US
CAHILL, John J.; US
HAULBROOK, William R.; US
JARRELL, Brenda Herschbach; US
LI, Xiaodong; US
LYON, Charles E.; US
MEDINA, Rolando; US
MONROE, Margo R.; US
NGUYEN, Suzanne P.; US
NIHAN, Danielle M.; US
PACE, Nicholas J.; US
PELLIGRINO, Jeffrey S.; US
REARICK, John P.; US
REESE, Brian E.; US
ROHLFS, Elizabeth M.; US
SAHR, Robert N.; US
SCHONEWALD, Stephanie L.; US
SHAIKH, Nishat A.; US
SHINALL, Michael A.; US
SMITH, Maria C.; US
SUH, Su Kyung; US
VETTER, Michael L.; US
VRABLIK, Tracy L.; US
WANG, Gang; US
Priority Data:
14/841,36931.08.2015US
Title (EN) CONDUCTIVE TEMPERATURE CONTROL
(FR) RÉGULATION THERMIQUE CONDUCTRICE
Abstract:
(EN) A test system includes a transporter having test sockets, where each test socket is configured to receive a device to be tested by the test system, and each test socket includes an element that is controllable to change a temperature of a device in the test socket through thermal conduction. The test system includes a test rack comprising slots. The transporter is configured for movement into, and out of, a slot of the test rack to test devices in the test sockets.
(FR) L'invention concerne un système de test qui comprend un transporteur ayant des logements de test, chaque logement de test étant configuré pour recevoir un dispositif à tester par le système de test, et chaque logement de test comprenant un élément qui est apte à être commandé pour changer une température d'un dispositif dans le logement de test par conduction thermique. Le système de test comprend un banc de test comprenant des fentes. Le transporteur est configuré pour un mouvement dans une fente du banc de test et hors de cette dernière pour tester des dispositifs dans les logements de test.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)