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1. (WO2017039561) THE 360 ALL AROUND TURN X-RAY DIFFRACTOMETER
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/039561 International Application No.: PCT/US2015/000096
Publication Date: 09.03.2017 International Filing Date: 04.09.2015
IPC:
G01N 23/20 (2006.01) ,G01N 23/207 (2006.01) ,G01N 23/205 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
20
by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
20
by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
207
by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
20
by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
205
by means of diffraction cameras
Applicants:
CHEUN, William, L. [CN/US]; US
Inventors:
CHEUN, William, L.; US
Priority Data:
Title (EN) THE 360 ALL AROUND TURN X-RAY DIFFRACTOMETER
(FR) DIFFRACTOMÈTRE À RAYONS X À 360 DEGRÉS
Abstract:
(EN) This application is an improvement of current in use traditional X-ray diffractometer, and has new sample holders, new X-ray diffraction spectrums recording system, and new method to analyze the recorded X-ray diffraction spectrum data. This new 360° All Around Turn X-Ray Diffractometer let samples turn around in X-rays 360° all around, and records the diffraction spectrum, unlike current in use traditional X-ray diffractometers that scan samples in limited less than 180° angles. The current in use X- ray diffractometer's spectrum do not allow the wave form decomposed into simple wave forms., and obtain sample crystal structure parameters. The 360° All Around Turn X-Ray Diffractometer is able to record the X-ray diffractions of single crystal, powder crystal, and macromolecules that have small angle diffraction in one machine, unlike the traditional X-ray diffractometer records the X-ray diffraction separately in different diffractometer, one kind diffractometer records one kind of X-ray diffraction.
(FR) Cette demande est une version perfectionnée du diffractomètre à rayons X classique actuellement utilisé, qui comporte de nouveaux porte-échantillons, un nouveau système d'enregistrement des spectres de diffraction des rayons X, et un nouveau procédé d'analyse des données spectrales de diffraction des rayons X enregistrées. Ce nouveau diffractomètre à rayons X à 360° laisse tourner les échantillons à 360°, et enregistre le spectre de diffraction, contrairement aux diffractomètres à rayons X classiques actuellement utilisés qui balayent les échantillons sous des angles limités inférieurs à 180°. Le spectre du diffractomètre à rayons X actuellement utilisé ne permet pas la décomposition de la forme d'onde en formes d'ondes simples, et l'obtention de paramètres sur la structure cristalline de l'échantillon. Le diffractomètre à rayons X à 360° peut enregistrer les diffractions de rayons X du monocristal, de la poudre de cristal, et de macromolécules ayant un petit angle de réfraction dans une seule et même machine, contrairement au diffractomètre à rayons X classique qui enregistre la diffraction des rayons X séparément dans des diffractomètres différents, un type de diffractomètre enregistrant un type de diffraction des rayons X.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)