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1. (WO2017039474) METHOD OF MEASURING S-PARAMETERS

Pub. No.:    WO/2017/039474    International Application No.:    PCT/RU2015/000551
Publication Date: Fri Mar 10 00:59:59 CET 2017 International Filing Date: Wed Sep 02 01:59:59 CEST 2015
IPC: G01R 27/32
Applicants: VECTOR MEASUREMENTS LABS LLC.
ОБЩЕСТВО С ОГРАНИЧЕННОЙ ОТВЕТСТВЕННОСТЬЮ "НАУЧНО-ИССЛЕДОВАТЕЛЬСКИЙ ИНСТИТУТ ВЕКТОРНЫХ ИЗМЕРЕНИЙ"
Inventors: TERENTIEV, Andrei Alexandrovich
ТЕРЕНТЬЕВ, Андрей Александрович
NIKULIN, Sergei Mikhailovich
НИКУЛИН, Сергей Михайлович
Title: METHOD OF MEASURING S-PARAMETERS
Abstract:
The invention can be used for measuring the scattering parameters of two-port UHF devices in large-signal mode. Measurements are carried out preferably with vector network analyzers (VNA) (3). An enhanced signal is fed from a first port of a VNA (3) to an input of the object under test (1). A reflected signal and a transmitted signal from the object under test (1) are fed to a second port of the VNA (3). The reflection coefficients and the transmission coefficients of the object under test (1) are measured while a spatially remote load (7) with two different impedance values is connected to an output of the object under test (1). On the basis of the measured coefficients, a complete S-parameter matrix is constructed.