Search International and National Patent Collections
|1. (WO2017038702) X-RAY FLUORESCENCE SPECTROMETER|
|Title:||X-RAY FLUORESCENCE SPECTROMETER|
A quantitative analysis condition setting means (13) provided in a scanning-type X-ray fluorescence spectrometer according to the present invention subjects a plurality of reference specimens (14) to qualitative analysis, and on the basis of the results thereof, sets a peak measurement angle for a measurement line of a specimen (1) to be analyzed under quantitative analysis conditions, obtains a single virtual profile by synthesizing the peak profile from the plurality of reference specimens (14) subjected to the qualitative analysis, and on the basis of the half-value width of a pre-set peak profile and the virtual profile, sets a background measurement angle for the measurement line of the specimen (1) to be analyzed under the quantitative analysis conditions.