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1. (WO2017038702) X-RAY FLUORESCENCE SPECTROMETER

Pub. No.:    WO/2017/038702    International Application No.:    PCT/JP2016/075034
Publication Date: Fri Mar 10 00:59:59 CET 2017 International Filing Date: Sat Aug 27 01:59:59 CEST 2016
IPC: G01N 23/223
G01N 23/207
Applicants: RIGAKU CORPORATION
株式会社リガク
Inventors: HARA, Shinya
原 真也
MATSUO, Takashi
松尾 尚
YAMADA, Yasujiro
山田 康治郎
HONMA, Hisashi
本間 寿
KATAOKA, Yoshiyuki
片岡 由行
Title: X-RAY FLUORESCENCE SPECTROMETER
Abstract:
A quantitative analysis condition setting means (13) provided in a scanning-type X-ray fluorescence spectrometer according to the present invention subjects a plurality of reference specimens (14) to qualitative analysis, and on the basis of the results thereof, sets a peak measurement angle for a measurement line of a specimen (1) to be analyzed under quantitative analysis conditions, obtains a single virtual profile by synthesizing the peak profile from the plurality of reference specimens (14) subjected to the qualitative analysis, and on the basis of the half-value width of a pre-set peak profile and the virtual profile, sets a background measurement angle for the measurement line of the specimen (1) to be analyzed under the quantitative analysis conditions.