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1. (WO2017038701) X-RAY FLUORESCENCE SPECTROMETER
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Pub. No.: WO/2017/038701 International Application No.: PCT/JP2016/075033
Publication Date: 09.03.2017 International Filing Date: 26.08.2016
IPC:
G01N 23/223 (2006.01) ,G01N 23/207 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
22
by measuring secondary emission
223
by irradiating the sample with X-rays and by measuring X-ray fluorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
20
by using diffraction of the radiation, e.g. for investigating crystal structure; by using reflection of the radiation
207
by means of diffractometry using detectors, e.g. using an analysing crystal or a crystal to be analysed in a central position and one or more displaceable detectors in circumferential positions
Applicants:
株式会社リガク RIGAKU CORPORATION [JP/JP]; 東京都昭島市松原町3丁目9番12号 9-12, Matsubara-cho 3-chome, Akishima-shi, Tokyo 1968666, JP
Inventors:
原 真也 HARA, Shinya; JP
松尾 尚 MATSUO, Takashi; JP
山田 康治郎 YAMADA, Yasujiro; JP
本間 寿 HONMA, Hisashi; JP
片岡 由行 KATAOKA, Yoshiyuki; JP
Agent:
杉本 修司 SUGIMOTO, Shuji; JP
野田 雅士 NODA, Masashi; JP
堤 健郎 TSUTSUMI, Takeo; JP
Priority Data:
2015-16954328.08.2015JP
Title (EN) X-RAY FLUORESCENCE SPECTROMETER
(FR) ANALYSEUR PAR FLUORESCENCE X
(JA) 蛍光X線分析装置
Abstract:
(EN) A scanning-type x-ray fluorescence spectrometer according to the present invention is equipped with a quantitative analysis condition setting means (13) for determining whether a newly detected element other than specimen-constituent elements that are set in advance on the basis of qualitative analysis results and semi-quantitative analysis results obtained from a reference specimen (14) should or should not be added as an element to be analyzed, on the basis of the degree of impact of the x-ray fluorescence absorption and excitation on the analysis values of the elements to be analyzed, and the degree of impact of an overlapping interfering line on the analysis lines of the elements to be analyzed.
(FR) Un analyseur par fluorescence de rayons X de type de balayage selon la présente invention est équipé d'un moyen de paramétrage de conditions d'analyse quantitative (13) permettant de déterminer si un élément nouvellement détecté autre que les éléments constitutifs de l'échantillon qui sont fixés à l'avance sur la base de résultats d'analyse qualitative et de résultats d'analyse semi-quantitative obtenus à partir d'un échantillon de référence (14) doit ou ne doit pas être ajouté en tant qu'élément à analyser, sur la base du degré d'impact de l'absorption et de l'excitation en fluorescence de rayons X sur les valeurs d'analyse des éléments à analyser, et du degré d'impact d'une ligne d'interférence avec chevauchement sur les ligne d'analyse des éléments à analyser.
(JA) 本発明の走査型の蛍光X線分析装置は、標準試料(14)の定性分析結果および半定量分析結果に基づいて、あらかじめ設定された試料構成元素以外の新規検出元素について、分析対象元素の分析値に対する蛍光X線の吸収励起影響度と、分析対象元素の分析線に対する妨害線の重なり影響度とから、分析対象元素として追加すべきか否かを判定する定量分析条件設定手段(13)を備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)