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1. (WO2017038622) CHARGED PARTICLE RADIATION MEASURING METHOD AND CHARGED PARTICLE RADIATION MEASURING DEVICE
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Pub. No.: WO/2017/038622 International Application No.: PCT/JP2016/074813
Publication Date: 09.03.2017 International Filing Date: 25.08.2016
IPC:
G01T 1/20 (2006.01) ,C09K 11/00 (2006.01) ,C09K 11/64 (2006.01) ,G01T 1/202 (2006.01)
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
20
with scintillation detectors
C CHEMISTRY; METALLURGY
09
DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
K
MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
11
Luminescent, e.g. electroluminescent, chemiluminescent, materials
C CHEMISTRY; METALLURGY
09
DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
K
MATERIALS FOR APPLICATIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
11
Luminescent, e.g. electroluminescent, chemiluminescent, materials
08
containing inorganic luminescent materials
64
containing aluminium
G PHYSICS
01
MEASURING; TESTING
T
MEASUREMENT OF NUCLEAR OR X-RADIATION
1
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
16
Measuring radiation intensity
20
with scintillation detectors
202
the detector being a crystal
Applicants:
国立大学法人群馬大学 NATIONAL UNIVERSITY CORPORATION GUNMA UNIVERSITY [JP/JP]; 群馬県前橋市荒牧町四丁目2番地 2, Aramaki-machi 4-chome, Maebashi-shi, Gunma 3718510, JP
国立研究開発法人量子科学技術研究開発機構 NATIONAL INSTITUTES FOR QUANTUM AND RADIOLOGICAL SCIENCE AND TECHNOLOGY [JP/JP]; 千葉県千葉市稲毛区穴川4丁目9番1号 4-9-1, Anagawa, Inage-ku, Chiba-shi, Chiba 2638555, JP
デンカ株式会社 DENKA COMPANY LIMITED [JP/JP]; 東京都中央区日本橋室町二丁目1番1号 1-1, Nihonbashi-Muromachi 2-chome, Chuo-ku, Tokyo 1038338, JP
Inventors:
加田 渉 KADA Wataru; JP
三浦 健太 MIURA Kenta; JP
花泉 修 HANAIZUMI Osamu; JP
神谷 富裕 KAMIYA Tomihiro; JP
佐藤 隆博 SATOH Takahiro; JP
須崎 純一 SUSAKI Junichi; JP
山田 鈴弥 YAMADA Suzuya; JP
Agent:
園田・小林特許業務法人 SONODA & KOBAYASHI INTELLECTUAL PROPERTY LAW; 東京都新宿区西新宿二丁目1番1号 新宿三井ビル34階 34th Floor, Shinjuku Mitsui Building, 1-1, Nishi-Shinjuku 2-chome, Shinjuku-ku, Tokyo 1630434, JP
Priority Data:
2015-16936328.08.2015JP
Title (EN) CHARGED PARTICLE RADIATION MEASURING METHOD AND CHARGED PARTICLE RADIATION MEASURING DEVICE
(FR) PROCÉDÉ DE MESURE DE RAYONNEMENT DE PARTICULES CHARGÉES ET DISPOSITIF DE MESURE DE RAYONNEMENT DE PARTICULES CHARGÉES
(JA) 荷電粒子放射線計測方法および荷電粒子放射線計測装置
Abstract:
(EN) [Problem] To provide a radiation measuring instrument having good heat resistance and radiation resistance. [Solution] Provided are a charged particle radiation measuring method and a charged particle radiation measuring device employing a scintillator containing a phosphor having SiAlON phosphor as the main component.
(FR) Le problème décrit par la présente invention est de fournir un instrument de mesure de rayonnement ayant une bonne résistance thermique et une bonne résistance aux rayonnements. La solution selon l'invention concerne un procédé de mesure de rayonnement de particules chargées et un dispositif de mesure de rayonnement de particules chargées utilisant un scintillateur contenant un luminophore ayant un luminophore en SiAlON comme composé principal.
(JA) 【課題】耐熱性及び放射線照射耐性の高い放射線計測機器を提供する。 【解決手段】SiAlON蛍光体を主成分とする蛍光体を含むシンチレータを用いる荷電粒子放射線計測方法および荷電粒子放射線計測装置を提供する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)