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1. (WO2017038511) NANOPARTICLE SCREENING METHOD AND SCREENING SYSTEM, AND NANOPARTICLES AND PRODUCTION METHOD THEREFOR
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2017/038511 International Application No.: PCT/JP2016/074273
Publication Date: 09.03.2017 International Filing Date: 19.08.2016
IPC:
G01N 21/64 (2006.01) ,B82Y 20/00 (2011.01) ,B82Y 35/00 (2011.01) ,G01N 21/27 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
Y
SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES
20
Nano-optics, e.g. quantum optics or photonic crystals
B PERFORMING OPERATIONS; TRANSPORTING
82
NANO-TECHNOLOGY
Y
SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES
35
Methods or apparatus for measurement or analysis of nano-structures
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
27
using photo-electric detection
Applicants:
国立研究開発法人産業技術総合研究所 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY [JP/JP]; 東京都千代田区霞が関1丁目3番1号 3-1, Kasumigaseki 1-chome, Chiyoda-ku, Tokyo 1008921, JP
NSマテリアルズ株式会社 NS MATERIALS INC. [JP/JP]; 福岡県筑紫野市立明寺511-1 511-1 Ryumyouji, Chikushino-city, Fukuoka 8180042, JP
Inventors:
中村 浩之 NAKAMURA, Hiroyuki; JP
佐伯 真紀 SAEKI, Maki; JP
田中 雅典 TANAKA, Masanori; JP
金海 榮一 KANAUMI, Eiichi; JP
Agent:
青木 宏義 AOKI, Hiroyoshi; JP
天田 昌行 AMADA, Masayuki; JP
木村 晋朗 KIMURA, Nobuaki; JP
三輪 正義 MIWA, Masayoshi; JP
Priority Data:
2015-16973628.08.2015JP
2015-16973928.08.2015JP
Title (EN) NANOPARTICLE SCREENING METHOD AND SCREENING SYSTEM, AND NANOPARTICLES AND PRODUCTION METHOD THEREFOR
(FR) PROCÉDÉ DE CRIBLAGE ET SYSTÈME DE CRIBLAGE DE NANOPARTICULES, ET NANOPARTICULES ET LEUR PROCÉDÉ DE PRODUCTION
(JA) ナノ粒子のスクリーニング方法及びスクリーニングシステム、並びに、ナノ粒子及びその製造方法
Abstract:
(EN) Provided are a nanoparticle screening method and screening system, with which surface modification conditions of nanoparticles can be efficiently explored, and the time, labour, and sample amount required for surface modification are reduced further than conventionally possible. This nanoparticle screening method is characterized by being provided with: a step in which a nanoparticle suspension is dispensed into each of a plurality of accommodation portions provided in an accommodation container; a step in which surface modification processing of the nanoparticles is performed under separate conditions for each accommodation portion; a step in which a dispersion medium is added into each of the accommodation portions, and evaluation samples obtained by mixing the nanoparticles and the dispersion medium are generated; and a step in which optical analysis is used to evaluate the evaluation samples in the respective accommodation portions.
(FR) La présente invention concerne un procédé de criblage et un système de criblage de nanoparticules, permettant d'explorer efficacement des conditions de modification de surface de nanoparticules, et de réduire, davantage qu'avec les procédé et système classiques, la durée, la main-d'œuvre et la quantité d'échantillon nécessaires pour la modification de surface. Ce procédé de criblage de nanoparticules est caractérisé en ce qu'il comprend : une étape dans laquelle une suspension de nanoparticules est distribuée dans chacune d'une pluralité de parties de logement disposées dans un récipient de logement; une étape dans laquelle un traitement de modification de surface des nanoparticules est mis en œuvre dans des conditions distinctes pour chaque partie de logement; une étape dans laquelle un milieu de dispersion est ajouté dans chacune des parties de logement, et des échantillons d'évaluation obtenus en mélangeant les nanoparticules et le milieu de dispersion sont générés; et une étape dans laquelle une analyse optique est utilisée pour évaluer les échantillons d'évaluation dans les parties de logement respectives.
(JA) 特に、ナノ粒子の表面改質条件を効率的に探索でき、表面改質に必要な時間と労力とサンプル量を従来よりも低減した、ナノ粒子のスクリーニング方法及びスクリーニングシステムを提供する。本発明のナノ粒子のスクリーニング方法は、収容容器に設けられた複数の収容部の夫々に、ナノ粒子懸濁液を小分けするステップと、ナノ粒子の表面改質処理を、前記収容部ごとに別条件にて行うステップと、各収容部内に分散媒を加えて、前記ナノ粒子と前記分散媒とを混合した評価サンプルを生成するステップと、各収容部の前記評価サンプルに対して、光学分析により評価を行うステップと、を有することを特徴とする。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)