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1. (WO2017038302) X-RAY GENERATION DEVICE AND METHOD, AND SAMPLE MEASUREMENT SYSTEM
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/038302 International Application No.: PCT/JP2016/071811
Publication Date: 09.03.2017 International Filing Date: 26.07.2016
IPC:
H01J 35/26 (2006.01) ,H01J 35/06 (2006.01) ,H01J 35/10 (2006.01)
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35
X-ray tubes
24
Tubes wherein the point of impact of the cathode ray on the anode or anticathode is movable relative to the surface thereof
26
by rotation of the anode or anticathode
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35
X-ray tubes
02
Details
04
Electrodes
06
Cathodes
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
35
X-ray tubes
02
Details
04
Electrodes
08
Anodes; Anticathodes
10
Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
Applicants:
ブルカージャパン株式会社 BRUKER JAPAN K.K. [JP/JP]; 神奈川県横浜市神奈川区守屋町三丁目9番地 3-9, Moriya-cho, Kanagawa-ku, Yokohama-shi, Kanagawa 2210022, JP
Inventors:
川崎 勝巳 KAWASAKI Katsumi; JP
千葉 大 CHIBA Hiroshi; JP
片山 忠二 KATAYAMA Chuji; JP
Agent:
アインゼル・フェリックス=ラインハルト EINSEL Felix-Reinhard; JP
前川 純一 MAEKAWA Junichi; JP
二宮 浩康 NINOMIYA Hiroyasu; JP
上島 類 UESHIMA Rui; JP
Priority Data:
2015-17010131.08.2015JP
2015-21441830.10.2015JP
Title (EN) X-RAY GENERATION DEVICE AND METHOD, AND SAMPLE MEASUREMENT SYSTEM
(FR) DISPOSITIF ET PROCÉDÉ DE GÉNÉRATION DE RAYONS X, ET SYSTÈME DE MESURE D'ÉCHANTILLON
(JA) X線発生装置及び方法、並びに試料測定システム
Abstract:
(EN) Provided are: a method and a device for generating x-rays, the x-ray generation device having an extremely simple device configuration and capable of selectively generating x-ray beams in point form or in line form; and a sample measurement system. The x-ray generation device (10) comprises an electron generator (24) and a rotating anticathode (26) which are disposed and fixed under such a positional relationship that an electron source (32) and a peripheral surface portion (38) face one another while a rotation axis (36) is inclined with respect to a first direction (Z direction) and a second direction (X direction).
(FR) L'invention concerne : un procédé et un dispositif permettant de générer des rayons x, le dispositif de génération de rayons x ayant une configuration de dispositif extrêmement simple et étant capable de générer sélectivement des faisceaux de rayons x en forme de point ou en forme de ligne; et un système de mesure d'échantillon. Le dispositif de génération de rayons x (10) comprend un générateur d'électrons (24) et une anticathode tournante (26) qui sont disposés et fixés suivant une relation de position telle qu'une source d'électrons (32) et une partie de surface périphérique (38) se font face tandis qu'un axe de rotation (36) est incliné par rapport à une première direction (direction Z) et une seconde direction (direction X).
(JA) きわめて簡単な装置構成でありながら点状又は線状のX線ビームを選択的に発生可能なX線発生装置及び方法、並びに試料測定システムを提供する。 X線発生装置(10)が備える電子発生器(24)及び回転対陰極(26)は、電子源(32)及び周面部(38)が互いに対向すると共に、回転軸(36)が第1方向(Z方向)及び第2方向(X方向)に対して傾斜する位置関係下に固定配置される。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)