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|1. (WO2017038095) PROGRAMMABLE LOGIC INTEGRATED CIRCUIT, SEMICONDUCTOR DEVICE, AND CHARACTERIZATION METHOD|
|Title:||PROGRAMMABLE LOGIC INTEGRATED CIRCUIT, SEMICONDUCTOR DEVICE, AND CHARACTERIZATION METHOD|
The purpose of the present invention is to provide a method for efficiently performing characterization of a programmable logic integrated circuit having a crossbar switch involving the use of a resistance change element, in order to perform circuit verification using static timing analysis. This programmable logic integrated circuit has a crossbar switch having a resistance change element and a logic circuit logically configured using the crossbar switch, wherein the programmable logic integrated circuit is divided into a plurality of leaf cells having a plurality of load circuits that have a portion of the crossbar switch and a power source element for inputting into the crossbar switch, the leaf cells are split into delay paths having a base leaf cell and a correction leaf cell, and circuits are verified on the basis of a delay information library in which the delay time of the base leaf cells and the correction delay for the correction leaf cells are integrated to obtain the delay time for the leaf cells.