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1. (WO2017037948) REFLECTION CHARACTERISTIC MEASURING SYSTEM

Pub. No.:    WO/2017/037948    International Application No.:    PCT/JP2015/075236
Publication Date: Fri Mar 10 00:59:59 CET 2017 International Filing Date: Sat Sep 05 01:59:59 CEST 2015
IPC: G01N 21/47
G01N 21/01
G01N 21/84
Applicants: OLYMPUS CORPORATION
オリンパス株式会社
Inventors: MIYOSHI, Takashi
三由 貴史
HORIE, Takuji
堀江 卓二
ISHII, Kensuke
石井 謙介
SHINOZAKI, Arata
篠崎 新
MATSUMOTO, Saori
松本 さおり
WATANABE, Nobuyuki
渡辺 伸之
FUKUDA, Hiroyuki
福田 弘之
Title: REFLECTION CHARACTERISTIC MEASURING SYSTEM
Abstract:
In order to perform a measurement while flexibly changing the direction of lighting and the wavelength with a simple structure, a reflection characteristic measuring system (1) according to the present invention is provided with: a display device (2) having a flat display screen (4) and capable of flexibly changing a lighting position; and a detection device (3) to be placed on the display screen (4) of the display device (2). The detection device (3) is provided with: a domed reflecting mirror (17) provided with an inner reflecting surface (17b) and an opening part (17a) passing through the reflecting surface (17b), the inner reflecting surface (17b) being placed at such a position as to cover at least a portion of the display screen (4) of the display device (2), and arranged to reflect light emitted from the lighting position of the display screen (4) so as to focus the light on a predetermined position; and a detection unit (18) that detects light reflected from an object (X) to be measured placed at the predetermined position and emitted out of the reflecting mirror (17) through the opening part (17a) of the reflecting mirror (17).