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1. (WO2017037887) TESTING DEVICE

Pub. No.:    WO/2017/037887    International Application No.:    PCT/JP2015/074928
Publication Date: Fri Mar 10 00:59:59 CET 2017 International Filing Date: Thu Sep 03 01:59:59 CEST 2015
IPC: H05K 13/08
Applicants: FUJI MACHINE MFG. CO., LTD.
富士機械製造株式会社
Inventors: ITO, Akira
伊藤 明
Title: TESTING DEVICE
Abstract:
A testing device for sorting and collecting components (s) after measuring the electrical properties thereof, the testing device including a support base (32), a pair of measurement probes (34, 36) that hold the components (s) supported by the support base (32), and are capable of measuring electrical properties, and a relative movement device for moving the support base (32) and the pair of measurement probes (34, 36) relative to one another. On the basis of the results obtained by measuring the electrical properties of the components (s), the testing device sorts and collects the components (s) by changing the relative positions of the movable probe (36) and the support base (32).