Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2017037873) MEASUREMENT DEVICE
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/037873 International Application No.: PCT/JP2015/074862
Publication Date: 09.03.2017 International Filing Date: 01.09.2015
IPC:
G01N 21/59 (2006.01) ,G01N 21/35 (2014.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
59
Transmissivity
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31
Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35
using infra-red light
Applicants:
パイオニア株式会社 PIONEER CORPORATION [JP/JP]; 東京都文京区本駒込二丁目28番8号 28-8, Honkomagome 2-chome, Bunkyo-ku, Tokyo 1130021, JP
日機装株式会社 NIKKISO COMPANY LIMITED [JP/JP]; 東京都渋谷区恵比寿4丁目20番3号 20-3, Ebisu 4-chome, Shibuya-ku, Tokyo 1506022, JP
Inventors:
菊池 育也 KIKUCHI, Ikuya; JP
伊藤 敦也 ITO, Atsuya; JP
Agent:
江上 達夫 EGAMI, Tatsuo; JP
Priority Data:
Title (EN) MEASUREMENT DEVICE
(FR) DISPOSITIF DE MESURE
(JA) 測定装置
Abstract:
(EN) This measurement device comprises: a laser light source (110) that emits a laser light toward an object (500) to be measured; an optical element (200) that is positioned in the light path of the laser light and exhibits wavelength-dependent transmittance such that the transmittance varies according to the wavelength of the laser light; and a detection unit (120) that detects the laser light transmitted through or reflected off the object to be measured and the optical element. The wavelength dependence of the transmittance of the optical element is set so that, within the range of wavelengths of the laser light, the combined wavelength dependence of the transmittance of the optical unit and the object to be measured is smaller than the wavelength dependence of the transmittance of the object to be measured. As a result, discrepancies in the measurement results caused by fluctuations of the laser light wavelength can be minimized.
(FR) Le dispositif de mesure de l’invention est équipé : d’une source de lumière laser (110) qui génère une lumière laser vers un objet à mesurer (500) ; d’un élément optique (200) qui est disposé sur le chemin optique de la lumière laser, et qui présente une dépendance de transmittance à la longueur d’onde telle que sa transmittance varie selon la longueur d’onde de la lumière laser ; et d’une partie détection (120) qui détecte la lumière laser transmise ou réfléchie au niveau de l’objet à mesurer et de l’élément optique. La dépendance à la longueur d’onde de la transmittance de l’élément optique, est établie de manière à ce que la dépendance à la longueur d’onde de la transmittance de l’élément optique et de l’objet à mesurer réunis, dans une plage de longueur d’onde de la lumière laser, est inférieure à la dépendance à la longueur d’onde de la transmittance de l’objet à mesurer. Ainsi, il est possible d’empêcher un décalage de résultat de mesure dû à une fluctuation de longueur d’onde d’une lumière laser.
(JA) 測定装置は、被測定対象(500)に向けてレーザ光を発するレーザ光源(110)と、レーザ光の光路上に配置されており、レーザ光の波長に応じて透過率が変化する透過率波長依存性を有する光学素子(200)と、被測定対象及び光学素子において透過又は反射されたレーザ光を検出する検出部(120)とを備える。光学素子の透過率波長依存性は、レーザ光の波長範囲において、光学素子及び被測定対象を合わせた透過率波長依存性が、被測定対象の透過率波長依存性よりも小さくなるように設定されている。これにより、レーザ光の波長変動に起因する測定結果のずれを抑制することができる。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)