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1. (WO2017036498) METHOD AND DEVICE FOR SENSING THE SURFACE STRUCTURE AND THE NATURE OF A SAMPLE
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/036498 International Application No.: PCT/EP2015/069768
Publication Date: 09.03.2017 International Filing Date: 28.08.2015
IPC:
G01N 21/3563 (2014.01) ,A61B 5/1172 (2016.01) ,G01S 17/89 (2006.01) ,G01B 11/24 (2006.01) ,G01N 21/47 (2006.01) ,G01N 21/84 (2006.01)
[IPC code unknown for G01N 21/3563][IPC code unknown for A61B 5/1172]
G PHYSICS
01
MEASURING; TESTING
S
RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
17
Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
88
Lidar systems, specially adapted for specific applications
89
for mapping or imaging
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
24
for measuring contours or curvatures
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
47
Scattering, i.e. diffuse reflection
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
Applicants:
MARX, Jürgen [DE/DE]; DE
Inventors:
MARX, Jürgen; DE
EBERL, Heinrich Alexander; DE
Agent:
MAIKOWSKI & NINNEMANN; Postfach 15 09 20 10671 Berlin, DE
Priority Data:
Title (EN) METHOD AND DEVICE FOR SENSING THE SURFACE STRUCTURE AND THE NATURE OF A SAMPLE
(FR) PROCÉDÉ ET DISPOSITIF POUR DÉTECTER LA STRUCTURE SUPERFICIELLE ET LA NATURE D'UN ÉCHANTILLON
(DE) VERFAHREN UND VORRICHTUNG ZUR ERFASSUNG DER OBERFLÄCHENSTRUKTUR UND BESCHAFFENHEIT EINER PROBE
Abstract:
(EN) The invention relates to a method for sensing the surface structure and the nature of a sample by means of a scanning apparatus (2), in particular for sensing marks caused by contact of the skin of the human body with the surface of an object or received by means of a mark carrier, wherein the sample (P) and the scanning apparatus (2) are moved in relation to each other, the sample surface is irradiated line by line with a light beam or laser beam (L) emitted by the scanning apparatus (2), the light beam or laser beam (R) reflected by the sample surface is sensed, and a digital image of the topography of the sample surface and of the intensity of the reflected light beam or laser beam (R) is produced from deviations of the reflected light beam or laser beam (R) from the emitted light beam or laser beam (L) in order to present the nature of the sample surface.
(FR) L'invention concerne un procédé pour détecter la structure superficielle et la nature d'un échantillon au moyen d'un dispositif de balayage (2), en particulier pour détecter des traces produites par le contact de la peau du corps humain avec la surface d'un objet ou figurant sur un relevé d'indices, l'échantillon (P) et le dispositif de balayage (2) étant déplacés l'un par rapport à l'autre. Selon ledit procédé, la surface de l'échantillon est balayée ligne par ligne par un rayon lumineux ou un rayon laser émis (L) par le dispositif de balayage (2), le rayon lumineux ou le rayon laser réfléchi (R) par la surface de l'échantillon est détecté, et à partir de divergences entre le rayon lumineux ou le rayon laser réfléchi (R) et le rayon lumineux ou le rayon laser émis (L), une image numérique de la topographie de la surface de l'échantillon et de l'intensité du rayon lumineux ou du rayon laser réfléchi (R) est générée pour représenter la nature de la surface de l'échantillon.
(DE) Bei einem Verfahren zur Erfassung der Oberflächenstruktur und Beschaffenheit einer Probe mittels einer Abtasteinrichtung (2), insbesondere zur Erfassung von durch Berührung der Haut des menschlichen Körpers auf der Oberfläche eines Gegenstands hervorgerufene oder mittels eines Spurenträgers aufgenommene Spuren, wobei die Probe (P) und die Abtasteinrichtung (2) relativ zueinander bewegt werden, wird die Probenoberfläche mit einem von der Abtasteinrichtung (2) abgegebenen Licht- oder Laserstrahl (L) zeilenweise bestrahlt, der von der Probenoberfläche reflektierte Licht- oder Laserstrahl (R) erfasst und aus Abweichungen des reflektierten Licht- oder Laserstrahls (R) vom abgegebenen Licht- oder Laserstrahl (L) ein digitales Bild der Topographie der Probenoberfläche und der Intensität des reflektierten Licht- oder Laserstrahls (R) zur Darstellung der Beschaffenheit der Probenoberfläche erzeugt.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: German (DE)
Filing Language: German (DE)