Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2017035005) AUTOMATED DELAY LINE ALIGNMENT
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2017/035005 International Application No.: PCT/US2016/047838
Publication Date: 02.03.2017 International Filing Date: 19.08.2016
IPC:
G01J 1/42 (2006.01) ,G01J 3/02 (2006.01) ,G01N 21/63 (2006.01) ,G01J 1/30 (2006.01) ,G01B 11/27 (2006.01)
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1
Photometry, e.g. photographic exposure meter
42
using electric radiation detectors
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02
Details
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1
Photometry, e.g. photographic exposure meter
10
by comparison with reference light or electric value
20
intensity of the measured or reference value being varied to equalise their effects at the detector, e.g. by varying incidence angle
28
using variation of intensity or distance of source
30
using electric radiation detectors
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
11
Measuring arrangements characterised by the use of optical means
26
for measuring angles or tapers; for testing the alignment of axes
27
for testing the alignment of axes
Applicants:
ULTRAFAST SYSTEMS LLC [US/US]; 1748 Independence Blvd., Bldg. G Sarasota, FL 34234, US
Inventors:
SOBOLEV, Alexander; US
KURAKIN, Nikita; US
GUSEV, Alexey; US
Agent:
STRODTHOFF, Kristine, M.; US
Priority Data:
62/208,54621.08.2015US
Title (EN) AUTOMATED DELAY LINE ALIGNMENT
(FR) ALIGNEMENT DE LIGNE DE RETARD AUTOMATISÉ
Abstract:
(EN) A system and method for aligning a light beam in a spectroscopic measuring device such as a pump-probe device is provided. The system and method comprise a first motorized mirror (66b) positioned to receive and transmit a light beam (60a); a second motorized mirror (66c) positioned relative to the first mirror to receive the light beam from the first mirror and transmit the light beam to a delay line (64); a third mirror (78) positioned to receive the light beam from the delay line and transmit said light beam to a detector (80); and a computer- based processor (82) in communication with the detector and the first and second mirrors, the processor configured to a) receive and process data relating to the light beam from the detector, and b) cause movement of the first and second mirrors to change an angle of the mirrors based on the data relating to the light beam.
(FR) La présente invention concerne un système et un procédé permettant d'aligner un faisceau lumineux dans un dispositif de mesure spectroscopique, tel qu'un dispositif de pompe-sonde. Le système et le procédé comprennent un premier miroir motorisé (66b) positionné de sorte à recevoir et à transmettre un faisceau de lumière (60a); un deuxième miroir motorisé (66c) positionné par rapport au premier miroir de sorte à recevoir le faisceau de lumière du premier miroir et à transmettre le faisceau de lumière à une ligne à retard (64); un troisième miroir (78) positionné de sorte à recevoir le faisceau de lumière de la ligne à retard et à transmettre ledit faisceau de lumière à un détecteur (80); et un processeur informatique (82) en communication avec le détecteur et les premier et deuxième miroirs, le processeur étant configuré de sorte : a) à recevoir et à traiter des données se rapportant au faisceau de lumière du détecteur et b) à provoquer le mouvement des premier et deuxième miroirs de sorte à modifier un angle des miroirs sur la base des données se rapportant au faisceau de lumière.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)