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1. (WO2017034755) MAGNETIC FIELD ENHANCING BACKING PLATE FOR MRAM WAFER TESTING
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/034755 International Application No.: PCT/US2016/044593
Publication Date: 02.03.2017 International Filing Date: 28.07.2016
Chapter 2 Demand Filed: 28.02.2017
IPC:
G11C 29/56 (2006.01) ,G11C 29/00 (2006.01) ,G01R 31/319 (2006.01)
G PHYSICS
11
INFORMATION STORAGE
C
STATIC STORES
29
Checking stores for correct operation; Testing stores during standby or offline operation
56
External testing equipment for static stores, e.g. automatic test equipment (ATE); Interfaces therefor
G PHYSICS
11
INFORMATION STORAGE
C
STATIC STORES
29
Checking stores for correct operation; Testing stores during standby or offline operation
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
319
Tester hardware, i.e. output processing circuits
Applicants:
QUALCOMM INCORPORATED [US/US]; ATTN: International IP Administration 5775 Morehouse Drive San Diego, California 92121-1714, US
Inventors:
KAN, Jimmy; US
GOTTWALD, Matthias Georg; US
PARK, Chando; US
KANG, Seung Hyuk; US
Agent:
LOZA, Julio; US
Priority Data:
14/836,86026.08.2015US
Title (EN) MAGNETIC FIELD ENHANCING BACKING PLATE FOR MRAM WAFER TESTING
(FR) PLAQUE D'APPUI AMÉLIORANT LE CHAMP MAGNÉTIQUE POUR LE TEST DE TRANCHES MRAM
Abstract:
(EN) A method and apparatus for testing a magnetic memory device is provided. The method begins when a magnetic field enhancing backing plate is installed in the test fixture. The magnetic field enhancing backing plate may be installed in the wafer chuck of a wafer testing probe station. The magnetic memory device is installed in the test fixture and a magnetic field is applied to the magnetic memory device. The magnetic field may be applied in-plane or perpendicular to the magnetic memory device. The performance of the magnetic memory device may be determined based on the magnetic field applied to the device. The apparatus includes a magnetic field enhancing backing plate adapted to fit a test fixture, possibly in the wafer chuck. The magnetic field enhancing backing plate is fabricated of high permeability magnetic materials, such as low carbon steel, with a thickness based on the magnetic field used in testing.
(FR) La présente invention concerne un procédé et un appareil pour tester un dispositif à mémoire magnétique. Le procédé démarre lorsqu'une plaque d'appui améliorant le champ magnétique est installée dans le montage de test. La plaque d'appui améliorant le champ magnétique peut être installée dans le support individuel de tranche d'une station de sonde de test de tranche. Le dispositif à mémoire magnétique est installé dans le montage de test et un champ magnétique est appliqué au dispositif à mémoire magnétique. Le champ magnétique peut être appliqué dans le plan ou perpendiculaire au plan du dispositif à mémoire magnétique. La performance du dispositif à mémoire magnétique peut être déterminée sur la base du champ magnétique appliqué au dispositif. L'appareil comporte une plaque d'appui améliorant le champ magnétique adaptée pour fixer un montage de test, si possible dans le support individuel de tranche. La plaque d'appui améliorant le champ magnétique est constituée de matériaux magnétiques à haute perméabilité, telle qu'un acier à faible teneur en carbone, avec une épaisseur basée sur le champ magnétique utilisé dans le test.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)