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1. (WO2017034144) CONTROL LINE DIAGNOSTIC APPARATUS
Latest bibliographic data on file with the International Bureau   

Pub. No.: WO/2017/034144 International Application No.: PCT/KR2016/007140
Publication Date: 02.03.2017 International Filing Date: 01.07.2016
IPC:
G01R 31/327 (2006.01) ,G01R 19/165 (2006.01) ,G01R 31/02 (2006.01) ,G01R 31/36 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
327
Testing of circuit interrupters, switches or circuit-breakers
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
19
Arrangements for measuring currents or voltages or for indicating presence or sign thereof
165
Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
02
Testing of electric apparatus, lines, or components for short-circuits, discontinuities, leakage, or incorrect line connection
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
36
Apparatus for testing electrical condition of accumulators or electric batteries, e.g. capacity or charge condition
Applicants:
주식회사 엘지화학 LG CHEM, LTD. [KR/KR]; 서울시 영등포구 여의대로 128 128, Yeoui-daero, Yeongdeungpo-gu, Seoul 07336, KR
Inventors:
김우중 KIM, Woo-Jung; KR
김태윤 KIM, Tae-Youn; KR
Agent:
특허법인 필앤온지 PHIL & ONZI INT'L PATENT & LAW FIRM; 서울시 서초구 서초중앙로 36, 3층 3F., 36 Seochojungang-ro Seocho-gu, Seoul 06643, KR
Priority Data:
10-2015-012032526.08.2015KR
Title (EN) CONTROL LINE DIAGNOSTIC APPARATUS
(FR) APPAREIL DE DIAGNOSTIC DE LIGNE DE COMMANDE
(KO) 제어라인 진단 장치
Abstract:
(EN) A control line diagnostic apparatus according to an embodiment of the present invention is a drive circuit for driving a drive load by flowing a current from a first high potential node to a first low potential node through a control line when a drive switch is turned on, and is an apparatus for diagnosing the control line of a drive circuit in which the potential of the drive switch is higher than the potential of the drive load. The control line diagnostic apparatus comprises: a first diagnostic line which has one end connected to a first node formed on the control line and the other end connected to a second high potential node, and comprises a first resistor, a second resistor and a first diode which are connected in series to each other; a second diagnostic line which has one end connected to the first node and the other end connected to a second low potential node, and comprises a third resistor; a voltage measurement unit for measuring the voltage of a second node formed between the first resistor and the second resistor; and a control unit for controlling the drive switch so as to set a predetermined operation mode and diagnosing the state of the control line by using the voltage value of the second node measured by the voltage measurement unit in the set operation mode, wherein the first diode may be provided on the first diagnostic line so as to allow a current to flow from the second high potential node to the first node.
(FR) Un appareil de diagnostic de ligne de commande selon un mode de réalisation de la présente invention est un circuit d'attaque pour attaquer une charge d'attaque en faisant circuler un courant d'un premier nœud à potentiel élevé vers un premier nœud à potentiel bas à travers une ligne de commande lorsqu'un commutateur d'attaque est mis en marche, et est un appareil pour diagnostiquer la ligne de commande d'un circuit d'attaque dans lequel le potentiel du commutateur d'attaque est supérieur au potentiel de la charge d'attaque. L'appareil de diagnostic de ligne de commande comprend : une première ligne de diagnostic qui a une extrémité connectée à un premier nœud formé sur la ligne de commande et l'autre extrémité connectée à un second nœud à potentiel élevé, et comprend une première résistance, une deuxième résistance et une première diode qui sont connectées en série les unes aux autres; une seconde ligne de diagnostic qui a une extrémité connectée au premier nœud et l'autre extrémité connectée à un second nœud à potentiel faible, et comprend une troisième résistance; une unité de mesure de tension pour mesurer la tension d'un second nœud formé entre la première résistance et la deuxième résistance; et une unité de commande pour commander le commutateur d'attaque de manière à régler un mode de fonctionnement prédéterminé et diagnostiquer l'état de la ligne de commande à l'aide de la valeur de tension du second nœud mesurée par l'unité de mesure de tension dans le mode de fonctionnement réglé, la première diode pouvant être disposée sur la première ligne de diagnostic de façon à permettre à un courant de circuler du second nœud à potentiel élevé vers le premier nœud.
(KO) 본 발명의 일 실시예에 따른 제어라인 진단 장치는, 구동스위치가 턴온될 경우 제어라인을 통해 제1고전위노드에서 제1저전위노드 방향으로 전류가 흘러 구동부하를 구동시키는 구동회로로서, 상기 구동스위치의 전위가 상기 구동부하의 전위보다 높은 구동회로의 상기 제어라인을 진단하는 장치로서, 일단이 상기 제어라인 상에 형성된 제1노드에 연결되고, 타단이 제2고전위노드에 연결되며, 서로 직렬 연결된 제1저항, 제2저항 및 제1다이오드를 구비하는 제1진단라인; 일단이 상기 제1노드에 연결되고, 타단이 제2저전위노드에 연결되며, 제3저항을 구비하는 제2진단라인; 상기 제1저항과 상기 제2저항 사이에 형성된 제2노드의 전압을 측정하는 전압측정부; 및 상기 구동스위치를 제어하여 소정 동작모드를 설정하고, 상기 설정된 동작모드에서 상기 전압측정부가 측정한 상기 제2노드의 전압값을 이용하여 상기 제어라인의 상태를 진단하는 제어부;를 포함하고, 상기 제1다이오드는, 상기 제2고전위노드에서 상기 제1노드방향으로의 전류의 흐름을 허용하도록 상기 제1진단라인에 구비될 수 있다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)