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1. (WO2017033708) TESTING DEVICE AND TESTING SYSTEM

Pub. No.:    WO/2017/033708    International Application No.:    PCT/JP2016/073108
Publication Date: Fri Mar 03 00:59:59 CET 2017 International Filing Date: Sat Aug 06 01:59:59 CEST 2016
IPC: G01N 21/67
Applicants: OLYMPUS CORPORATION
オリンパス株式会社
Inventors: AKAGANE, Tsunetaka
銅 庸高
Title: TESTING DEVICE AND TESTING SYSTEM
Abstract:
Provided is a testing device equipped with a gas supply path through which passes a gas supplied from a gas supply source, and electrodes which apply a voltage when supplied with electrical energy. In response to the voltage applied by the electrodes, the gas that has passed through the gas supply path becomes ionized, and a low-temperature plasma is generated at atmospheric pressure. The testing device is provided with a head, and the head has a jet orifice for jetting the generated low-temperature plasma towards a subject which is a conductor coated with an insulating film having electrical insulating properties.