Search International and National Patent Collections

1. (WO2017033648) AUTOMATED ANALYZER AND AUTOMATED ANALYSIS SYSTEM

Pub. No.:    WO/2017/033648    International Application No.:    PCT/JP2016/071665
Publication Date: Fri Mar 03 00:59:59 CET 2017 International Filing Date: Tue Jul 26 01:59:59 CEST 2016
IPC: G01N 35/00
Applicants: HITACHI HIGH-TECHNOLOGIES CORPORATION
株式会社 日立ハイテクノロジーズ
Inventors: SASAKI Shunsuke
佐々木 俊輔
IMAI Kenta
今井 健太
SUZUKI Toshiharu
鈴木 寿治
SAKAMOTO Katsuhiko
坂本 和彦
Title: AUTOMATED ANALYZER AND AUTOMATED ANALYSIS SYSTEM
Abstract:
The purpose of the present invention is to attain an automated analyzer that keeps the costs required for inspection to a minimum and is capable of starting measurement immediately after being turned on. As a solution, provided is an automated analyzer provided with an analysis operation part that causes a sample and a reagent to react and on the basis of the reaction result performs analysis of the sample, wherein: the automated analyzer comprises a plurality of units constituting the analysis operation part, a temperature adjustment mechanism that heats or cools the units, a temperature sensor that measures the temperature of the units, and a control part that controls the temperature adjustment mechanism; and the control part sets the measurement startable temperature range of each unit, which is the temperature range of the operation specification thereof, and the operable temperature range, which is a temperature range that is wider than the measurement startable temperature range, and starts the analysis process of the sample when the temperature of the unit has entered the operable temperature range of the unit.