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1. (WO2017033526) THERMAL ANALYSIS APPARATUS

Pub. No.:    WO/2017/033526    International Application No.:    PCT/JP2016/067019
Publication Date: Fri Mar 03 00:59:59 CET 2017 International Filing Date: Thu Jun 09 01:59:59 CEST 2016
IPC: G01N 25/00
G01N 5/04
G01N 25/20
Applicants: RIGAKU CORPORATION
株式会社リガク
Inventors: TANAKA, Nobuhiro
田中 宣弘
NORITAKE, Koichiro
則武 弘一郎
Title: THERMAL ANALYSIS APPARATUS
Abstract:
This thermal analysis apparatus is provided with a sample changer 40 that performs automatic changing of sample containers 13a, 13b. An imaging device 50 is attached to an outer frame 30 of a heating furnace 20 through a mounting part 51, and this imaging device 50 is used to visually observe a sample through an opening 24 formed in the heating furnace 20. The imaging device 50 is movable from the vicinity of a measurement position together with the heating furnace 20. The vicinity of the measurement position can thus be made open to allow the sample changer 40 to place the sample containers 13a, 13b at the measurement position and remove the sample containers 13a, 13b from the measurement position without obstruction.