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1. (WO2017032512) OMNIDIRECTIONAL SCATTERING- AND BIDIRECTIONAL PHASE-SENSITIVITY WITH SINGLE SHOT GRATING INTERFEROMETRY

Pub. No.:    WO/2017/032512    International Application No.:    PCT/EP2016/067234
Publication Date: Fri Mar 03 00:59:59 CET 2017 International Filing Date: Thu Jul 21 01:59:59 CEST 2016
IPC: G01N 23/20
A61B 6/00
G01N 23/04
G01N 23/201
Applicants: PAUL SCHERRER INSTITUT
Inventors: KAGIAS, Matias
STAMPANONI, Marco
WANG, Zhentian
Title: OMNIDIRECTIONAL SCATTERING- AND BIDIRECTIONAL PHASE-SENSITIVITY WITH SINGLE SHOT GRATING INTERFEROMETRY
Abstract:
X-ray scattering imaging can provide complementary information about the unresolved microstructures of a sample. The scattering signal can be accessed with various methods based on coherent illumination, which span from self-imaging to speckle scanning. The directional sensitivity of the existing methods is limited to a few directions on the imaging plane and it requires the scanning of the optical components, or the rotation of either the sample or the imaging setup, if the full range of possible scattering directions is desired. The present invention discloses a new arrangement that allows the simultaneous acquisition of the scattering images in all possible directions in a single shot. This is achieved by a specialized phase grating and means of recording the generated interference fringe with sufficient spatial resolution. The proposed technique decouples the sample dark-field signal with the sample orientation, which can be crucial for medical and industrial applications.