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1. (WO2017022234) MANUFACTURING PROCESS ANALYSIS DEVICE, MANUFACTURING PROCESS ANALYSIS METHOD, AND RECORDING MEDIUM WHEREUPON MANUFACTURING PROCESS ANALYSIS PROGRAM IS STORED

Pub. No.:    WO/2017/022234    International Application No.:    PCT/JP2016/003542
Publication Date: Fri Feb 10 00:59:59 CET 2017 International Filing Date: Wed Aug 03 01:59:59 CEST 2016
IPC: G05B 19/418
G06Q 50/04
Applicants: NEC CORPORATION
日本電気株式会社
Inventors: KAWAI, Takazumi
河合 孝純
OCHIAI, Katsuhiro
落合 勝博
Title: MANUFACTURING PROCESS ANALYSIS DEVICE, MANUFACTURING PROCESS ANALYSIS METHOD, AND RECORDING MEDIUM WHEREUPON MANUFACTURING PROCESS ANALYSIS PROGRAM IS STORED
Abstract:
The purpose of the present invention is to analyze a problem present in a manufacturing process with higher precision than previously possible, on the basis of data collected in time series which describes a state of the manufacturing process. Provided is a manufacturing process analysis device (30), comprising: a computation unit (31) which computes, in a process in which a manufactured object is manufactured, invariant compliance strengths for each shift time for manufacturing condition values (360) and quality values (361) which are measured in time series; a shift time specification unit (32) which derives, as a specified shift time, a shift time for which the invariant compliance strengths satisfy a baseline; and an analysis unit (33) which analyzes the state of the manufacturing process on the basis of the quality value and the manufacturing condition value for the time which is earlier by the specified shift time than the time at which the quality value is measured.