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1. (WO2016187259) MEASUREMENT SYSTEM AND METHOD
Latest bibliographic data on file with the International Bureau   

Pub. No.:    WO/2016/187259    International Application No.:    PCT/US2016/033004
Publication Date: 24.11.2016 International Filing Date: 18.05.2016
IPC:
G01C 22/00 (2006.01)
Applicants: WAL-MART STORES, INC. [US/US]; 702 S.W. 8th Street Bentonville, AR 72716 (US)
Inventors: HIGH, Donald; (US).
MCHALE, Brian, Gerard; (GB)
Agent: BURNS, David, R.; (US)
Priority Data:
62/163,584 19.05.2015 US
Title (EN) MEASUREMENT SYSTEM AND METHOD
(FR) SYSTÈME ET PROCÉDÉ DE MESURE
Abstract: front page image
(EN)Exemplary embodiments of the present disclosure are directed to measuring lengths in a physical environment using one or more sensors. The sensors can be arranged in one or more configurations and can use one or more methodologies for carrying the measurement of lengths.
(FR)Des exemples de modes de réalisation de la présente invention visent à mesurer des longueurs dans un environnement physique à l'aide d'un ou de plusieurs capteurs. Lesdits capteurs peuvent être disposés selon une ou plusieurs configurations et peuvent utiliser une ou plusieurs méthodologies pour pouvoir mesurer des longueurs.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)