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1. (WO2016173481) RAPID THERMAL TREATMENT METHOD AND APPARATUS FOR PINNING LAYER OF SPINTRONIC DEVICE
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Pub. No.:
WO/2016/173481
International Application No.:
PCT/CN2016/080195
Publication Date:
03.11.2016
International Filing Date:
26.04.2016
IPC:
H01L 43/12
(2006.01),
G01R 33/09
(2006.01)
H
ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
43
Devices using galvano-magnetic or similar magnetic effects; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof
12
Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
G
PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33
Arrangements or instruments for measuring magnetic variables
02
Measuring direction or magnitude of magnetic fields or magnetic flux
06
using galvano-magnetic devices
09
Magneto-resistive devices
Applicants:
MULTIDIMENSION TECHNOLOGY CO., LTD
[CN/CN]; No.7 Guangdong Road, Free Trade Zone Zhangjiagang, Jiangsu 215634 (CN)
Inventors:
DEAK, James Geza
; (CN)
Agent:
SUZHOU CREATOR PATENT & TREADMARK AGENCY LTD.
; No.93 Ganjiang West Road Suzhou, Jiangsu 215002 (CN)
Priority Data:
201510204777.4
27.04.2015
CN
Title
(EN)
RAPID THERMAL TREATMENT METHOD AND APPARATUS FOR PINNING LAYER OF SPINTRONIC DEVICE
(FR)
PROCÉDÉ ET APPAREIL DE TRAITEMENT THERMIQUE RAPIDE POUR COUCHE DE PIÉGEAGE DE DISPOSITIF SPINTRONIQUE
(ZH)
用于自旋电子器件钉扎层的快速热处理方法和装置
Abstract:
(EN)
A rapid thermal treatment method and apparatus for pinning layer of a local programming spintronic device, the apparatus comprising a rapid thermal annealing light source (31), a reflective cover, a magnet, a wafer (34), and a substrate (55), the light source being used to heat the substrate, the reflective cover at least comprising a transparent insulating layer (33, 51, 53) and a reflective layer (32, 52), the magnet being used to produce a constant magnetic field; by means of controlling the light exposure time, heating a heating area of the wafer (34) to above the blocking temperature of an anti-ferromagnetic layer (47), and then when cooling same in the magnetic field, closing the magnetic field, such that the anti-ferromagnetic layer (47) is secured. The present rapid thermal treatment method uses rapid thermal annealing to improve the spatial resolution of laser annealing, has good performance and is suitable for large-scale production.
(FR)
La présente invention porte sur un procédé et un appareil de traitement thermique rapide pour couche de piégeage d'un dispositif spintronique à programmation locale, l'appareil comprenant une source de lumière de recuit thermique rapide (31), un couvercle réfléchissant, un aimant, une tranche (34), et un substrat (55), la source de lumière étant utilisée pour chauffer le substrat, le couvercle réfléchissant comprenant au moins une couche isolante transparente (33, 51, 53) et une couche réfléchissante (32, 52), l'aimant étant utilisé pour produire un champ magnétique constant; par l'intermédiaire de la commande du temps d'exposition à la lumière, le chauffage d'une zone de chauffage de la tranche (34) à au-dessus de la température de blocage d'une couche anti-ferromagnétique (47), et ensuite lors du refroidissement de cette dernière dans le champ magnétique, la fermeture du champ magnétique, de telle sorte que la couche anti-ferromagnétique (47) est fixée. Le procédé de traitement thermique rapide de la présente invention utilise un recuit thermique rapide afin d'améliorer la résolution spatiale de recuit au laser, présente une bonne performance et est approprié pour une production à grande échelle.
(ZH)
一种用于本地编程的自旋电子器件钉扎层的快速热处理装置及方法,该装置包括快速热退火光源(31)、反射罩、磁铁、晶圆(34)、基片(55),其中光源用于加热基片,反射罩至少包括一个透明的绝缘层(33,51,53)和反射层(32,52),磁铁用于产生恒定的磁场,通过控制曝光时间,让晶圆(34)的加热区域加热到反铁磁层(47)阻隔温度之上,然后在应用的磁场中冷却下来,关闭磁场,反铁磁层(47)被固定。该快速热处理的方法采用快速热退火提高了激光退火的空间分辨率,且性能优良,适合大批量生产。
Designated States:
AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language:
Chinese (
ZH
)
Filing Language:
Chinese (
ZH
)