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1. WO2016152221 - INFRARED TEMPERATURE SENSOR AND DEVICE USING INFRARED TEMPERATURE SENSOR

Publication Number WO/2016/152221
Publication Date 29.09.2016
International Application No. PCT/JP2016/051664
International Filing Date 21.01.2016
IPC
G01J 5/04 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
02Details
04Casings
G01J 1/02 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1Photometry, e.g. photographic exposure meter
02Details
G01J 5/02 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
02Details
G01J 5/10 2006.01
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
10using electric radiation detectors
H01L 35/00 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
35Thermoelectric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermoelectric effects or thermomagnetic effects; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
H01L 37/02 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
37Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using Nernst-Ettinghausen effect; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof
02using thermal change of dielectric constant, e.g. working above and below the Curie point
CPC
G01J 1/02
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1Photometry, e.g. photographic exposure meter
02Details
G01J 5/02
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
02Details
G01J 5/04
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
02Details
04Casings ; Mountings
G01J 5/10
GPHYSICS
01MEASURING; TESTING
JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5Radiation pyrometry
10using electric radiation detectors
H01L 35/00
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
35Thermoelectric devices comprising a junction of dissimilar materials, i.e. exhibiting Seebeck or Peltier effect with or without other thermoelectric effects or thermomagnetic effects; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
H01L 37/02
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
LSEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
37Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using Nernst-Ettinghausen effect; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof
02using thermal change of dielectric constant, e.g. working above and below Curie point ; , e.g. pyroelectric devices
Applicants
  • SEMITEC株式会社 SEMITEC CORPORATION [JP]/[JP]
Inventors
  • 野尻 俊幸 NOJIRI Toshiyuki
  • 布施 武士 FUSE Takeshi
  • 碓井 正幸 USUI Masayuki
  • 細水 亮 HOSOMIZU Ryo
Agents
  • 和泉 順一 IZUMI Junichi
Priority Data
2015-06320825.03.2015JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) INFRARED TEMPERATURE SENSOR AND DEVICE USING INFRARED TEMPERATURE SENSOR
(FR) CAPTEUR DE TEMPÉRATURE INFRAROUGE ET DISPOSITIF DOTÉ DUDIT CAPTEUR DE TEMPÉRATURE INFRAROUGE
(JA) 赤外線温度センサ及び赤外線温度センサを用いた装置
Abstract
(EN)
Provided is an infrared temperature sensor that is configured such that, as a result of the dimensional precision of an opening in a light-guiding part being improved, variability in the output characteristics of different individual infrared temperature sensors can be suppressed. The present invention is provided with: a thermally conductive main body 2 that is provided with a light-guiding part 21 that has an opening 21a and that guides infrared light and with a shielding part 22 that has a shielding wall 22a and that shields infrared light, the length of at least the shortest part of the opening 21a being 1-6 mm, and at least the light-guiding part 21 being blackened; a substrate 3 that is held by the main body 2 and that has a wiring pattern 31 formed thereon; an infrared-light-detection heat-sensitive element 4 that is arranged upon the substrate 3 in a position that corresponds to the light-guiding part 21; and a temperature-compensation heat-sensitive element 5 that is arranged upon the substrate 3 so as to be separated from the infrared-light-detection heat-sensitive element 4 and that is arranged in a position that corresponds to the shielding part 22.
(FR)
L'invention concerne un capteur de température infrarouge qui est configuré de telle sorte que l'amélioration de la précision dimensionnelle d'une ouverture dans une partie de guidage de lumière permet de supprimer les variations des caractéristiques de sortie de différents capteurs de température infrarouges individuels. La présente invention comprend : un corps principal (2) thermiquement conducteur qui est pourvu d'une partie de guidage de lumière (21) qui présente une ouverture (21a) et qui guide la lumière infrarouge, et une partie de blindage (22) qui présente une paroi de blindage (22a) et qui protège de la lumière infrarouge, la longueur d'au moins la partie la plus courte de l'ouverture (21a) étant de 1-6 mm, et au moins la partie de guidage de lumière (21) étant assombrie ; un substrat (3) qui est maintenu par le corps principal (2) et sur lequel est formé un motif de câblage (31) ; un élément de détection de lumière infrarouge sensible à la chaleur (4) qui est disposé sur le substrat (3) dans une position qui correspond à la partie de guidage de lumière (21) ; et un élément de compensation de température sensible à la chaleur (5) qui est disposé sur le substrat (3) de manière à être séparé de l'élément de détection de lumière infrarouge sensible à la chaleur (4) et qui est agencé dans une position qui correspond à la partie de blindage (22).
(JA)
 導光部における開口部の寸法精度を高精度化することにより、個々の赤外線温度センサの出力特性のばらつきを抑制できる赤外線温度センサを提供する。 開口部21aを有し、その開口部21aの少なくとも最短部の寸法が1mm~6mmである赤外線を導く導光部21と、遮蔽壁22aを有して赤外線を遮蔽する遮蔽部22とを備え、少なくとも導光部21が黒体化された熱伝導性の本体2と、前記本体2に保持され、配線パターン31が形成された基板3と、前記基板3上に配置され、前記導光部21に対応する位置に配設された赤外線検知用感熱素子4と、前記基板3上に、前記赤外線検知用感熱素子4と離間されて配置され、前記遮蔽部22に対応する位置に配設された温度補償用感熱素子5とを備えている。
Also published as
Latest bibliographic data on file with the International Bureau