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1. WO2016145041 - SYSTEMS AND METHODS FOR RELAY IONIZATION

Publication Number WO/2016/145041
Publication Date 15.09.2016
International Application No. PCT/US2016/021506
International Filing Date 09.03.2016
IPC
H01J 49/04 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
B01D 59/00 2006.01
BPERFORMING OPERATIONS; TRANSPORTING
01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
DSEPARATION
59Separation of different isotopes of the same chemical element
B01D 59/44 2006.01
BPERFORMING OPERATIONS; TRANSPORTING
01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
DSEPARATION
59Separation of different isotopes of the same chemical element
44Separation by mass spectrography
H01J 37/00 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
H01J 37/252 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
37Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
252Tubes for spot-analysing by electron or ion beams; Microanalysers
H01J 49/00 2006.01
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
CPC
H01J 49/00
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
H01J 49/04
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
H01J 49/0409
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
0409Sample holders or containers
H01J 49/165
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
10Ion sources; Ion guns
16using surface ionisation, e.g. field-, thermionic- or photo-emission
165Electrospray ionisation
H01J 49/167
HELECTRICITY
01BASIC ELECTRIC ELEMENTS
JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
49Particle spectrometers or separator tubes
02Details
10Ion sources; Ion guns
16using surface ionisation, e.g. field-, thermionic- or photo-emission
165Electrospray ionisation
167Capillaries and nozzles specially adapted therefor;
Applicants
  • PURDUE RESEARCH FOUNDATION [US]/[US]
Inventors
  • COOKS, Robert Graham
  • LI, Anyin
  • HOLLERBACH, Adam
Agents
  • SCHOEN, Adam M.
Priority Data
62/130,15409.03.2015US
62/293,35510.02.2016US
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) SYSTEMS AND METHODS FOR RELAY IONIZATION
(FR) SYSTÈMES ET PROCÉDÉS POUR IONISATION DE RELAIS
Abstract
(EN)
The invention generally relates to systems and methods for relay ionization of a sample. In certain aspects, the invention provides systems that include an ion source that generates ions, a sample emitter configured to hold a sample, and a mass spectrometer. The system is configured such that the ions generated by the ion source are directed to interact with the sample emitter, thereby causing the sample to be discharged from the sample emitter and into the mass spectrometer.
(FR)
La présente invention concerne de façon générale des systèmes et des procédés pour ionisation de relais d'un échantillon. Selon certains aspects, le présente invention porte sur des systèmes qui comprennent une source d'ions qui génère des ions, un émetteur d'échantillon configuré pour maintenir un échantillon, et un spectromètre de masse. Le système est configuré de telle sorte que les ions générés par la source d'ions sont dirigés pour entrer en interaction avec l'émetteur d'échantillon, ce qui amène l'échantillon à se décharger de l'émetteur d'échantillon et dans le spectromètre de masse.
Also published as
Latest bibliographic data on file with the International Bureau