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1. WO2016140505 - A TEST DEVICE

Publication Number WO/2016/140505
Publication Date 09.09.2016
International Application No. PCT/KR2016/002077
International Filing Date 02.03.2016
IPC
G01R 31/26 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
26Testing of individual semiconductor devices
G01R 1/04 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
04Housings; Supporting members; Arrangements of terminals
G01R 1/073 2006.01
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types covered by groups G01R5/-G01R13/122
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
CPC
G01R 1/0466
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
04Housings; Supporting members; Arrangements of terminals
0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
0433Sockets for IC's or transistors
0441Details
0466concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
G01R 1/07314
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
1Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
02General constructional details
06Measuring leads; Measuring probes
067Measuring probes
073Multiple probes
07307with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
07314the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
Applicants
  • LEENO INDUSTRIAL INC. [KR]/[KR]
Inventors
  • BAEK, Seung Ha
Agents
  • SEO, Dong Heon
Priority Data
10-2015-002995103.03.2015KR
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) A TEST DEVICE
(FR) DISPOSITIF DE TEST
Abstract
(EN)
Disclosed is a test device for testing electric characteristics of a test object having a test contact point. The test device includes an insert which accommodates the test object; a socket which supports a plurality of probes having one end portion to be in contact with the test contact point of the test object; and a test object tray which is arranged on the socket, seats thereon the test object transferred from the insert during a test, and comprises a probe hole on a bottom thereof corresponding to the test contact point of the test object.
(FR)
L'invention concerne un dispositif de test servant à tester les caractéristiques électriques d'un objet à tester ayant un point de contact de test. Le dispositif de test comprend un insert qui loge l'objet à tester ; une prise de vérification qui supporte une pluralité de sondes comportant une partie extrémité pour un contact avec le point de contact de test de l'objet à tester ; et un plateau porte-objet à tester qui est disposé sur la prise de vérification, assied sur celle-ci l'objet à tester transféré depuis l'insert au cours d'un test, et comprend un trou de sondage sur un fond associé correspondant au point de contact de test de l'objet à tester.
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